Design of accelerated reliability tests based on simple-step-stress model

Yasuhiko Takemoto, Ikuo Arizono

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

The accelerated life tests can obtain information on life-time characteristics of products quickly. Then, the products can be submitted to higher levels of stress in various ways such as constant, step, and progress stress. In a constant-stress model, products are run under a constant level of stress until all products fail or a time limit is reached. A step-stress model allows the stress setting to be changed at a prescribed time or upon the occurrence of a fixed number of failures. In a progress-stress model, the stress is continuously increased over time. Until now, under the assumption of the functional relationship between the parameters of lifetime distribution and applied stress, there are many studies about parameter estimation using data obtained from an accelerated life test. In this study, instead of the parameter estimate problem, we consider a new design procedure of accelerated life tests based on the simple-step-stress model for assuring the mean time to failure (MTTF) at usual stress with specified producer and consumer risks under the condition that the parameters of the lifetime distribution at two stress levels are provided. The practical usage of the proposed design procedure is illustrated through some numerical examples.

Original languageEnglish
Title of host publicationProceedings of the Annual Reliability and Maintainability Symposium
Pages111-116
Number of pages6
Publication statusPublished - 2003
Externally publishedYes
EventThe International Symposium on Product Quality and Integrity; Transforming Technologies for Reliability and Maintainbility Engineering - Tampa, FL, United States
Duration: Jan 27 2003Jan 30 2003

Other

OtherThe International Symposium on Product Quality and Integrity; Transforming Technologies for Reliability and Maintainbility Engineering
CountryUnited States
CityTampa, FL
Period1/27/031/30/03

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Keywords

  • Accelerated reliability tests
  • Mean time to failure (MTTF)
  • Shape parameter
  • Simple-step-stress model
  • Variable sampling plan
  • Weibull distribution

ASJC Scopus subject areas

  • Engineering(all)
  • Engineering (miscellaneous)

Cite this

Takemoto, Y., & Arizono, I. (2003). Design of accelerated reliability tests based on simple-step-stress model. In Proceedings of the Annual Reliability and Maintainability Symposium (pp. 111-116)