Demonstrating a holographic memory having 100 Mrad total-ionizing-dose tolerance

Yoshizumi Ito, Minoru Watanabe, Akifumi Ogiwara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Currently, space systems require highly radiation tolerant memory. If memory with high radiation tolerance were available, then shielding of embedded systems for use in space could be reduced or removed, thereby greatly decreasing the weight of such space embedded systems. This study examines the radiation-hardened characteristics of a holographic memory. Using a cobalt 60 gamma radiation source, radiation experiments were conducted for a photopolymer holographic memory. Results show that the holographic memory can function correctly at a 100 Mrad total-ionizing dose. The radiation tolerance of the holographic memory is over 300 times higher than that of an electrically erasable programmable read-only memory (EEPROM). Moreover, this paper shows a demonstration applied for an optically reconfigurable gate array. The configuration procedure could be executed by using the radiation-damaged holographic memory.

Original languageEnglish
Title of host publicationProceedings of 2016 7th International Conference on Mechanical and Aerospace Engineering, ICMAE 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages377-380
Number of pages4
ISBN (Electronic)9781467388290
DOIs
Publication statusPublished - Aug 23 2016
Externally publishedYes
Event7th International Conference on Mechanical and Aerospace Engineering, ICMAE 2016 - London, United Kingdom
Duration: Jul 18 2016Jul 20 2016

Publication series

NameProceedings of 2016 7th International Conference on Mechanical and Aerospace Engineering, ICMAE 2016

Conference

Conference7th International Conference on Mechanical and Aerospace Engineering, ICMAE 2016
Country/TerritoryUnited Kingdom
CityLondon
Period7/18/167/20/16

Keywords

  • holographic memory
  • radiation hardened memory

ASJC Scopus subject areas

  • Aerospace Engineering
  • Mechanical Engineering

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