Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse

Atsushi Ishiyama, Yukiyasu Nishio, Hiroshi Ueda, Naoji Kashima, Masami Mori, Tomonori Watanabe, Shigeo Nagaya, Masashi Yagi, Shinichi Mukoyama, Takato Machi, Yuh Shiohara

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

YBCO tapes are expected to be used in future high temperature superconducting (HTS) applications because of their good Jc characteristics at high temperatures and in high applied magnetic fields. In applications to electric power devices such as transmission cables, transformers, and fault current limiters, the HTS conductors will be subjected to short-circuit fault currents that are 10 to 30 times the normal operating current. These overcurrents are greater than the critical current, and degrade or burn-out the HTS conductors. Therefore, it is important to clarify the mechanism of the degradation caused by such overcurrent pulses. We carried out preliminary experiments on damage caused by overcurrent pulse drive, focusing on the temperature limitation without suffering degradation for overcurrent pulse operation. A 10-mm-wide YBCO tape was cut into 2-mm-wide sample tapes by a laser beam, and the sample tapes were soldered on silver-deposited 100-μm-thick copper plates. Overcurrent tests were carried out on these sample tapes and Ic degradation was investigated. In addition the contact interface between YBCO and the Ag layer or buffer layer before and after the overcurrent drives has been investigated in order to clarify the correlation between the degradation and delamination of sample tapes.

Original languageEnglish
Article number5067186
Pages (from-to)3483-3486
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume19
Issue number3
DOIs
Publication statusPublished - Jun 2009
Externally publishedYes

Fingerprint

Tapes
tapes
conductors
degradation
Degradation
pulses
Temperature
Fault current limiters
Electric fault currents
Critical currents
short circuits
Buffer layers
electric power
Silver
Delamination
transformers
Short circuit currents
cables
Laser beams
Copper

Keywords

  • Degradation
  • Overcurrent pulse
  • Temperature limitation
  • YBCO tape

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Ishiyama, A., Nishio, Y., Ueda, H., Kashima, N., Mori, M., Watanabe, T., ... Shiohara, Y. (2009). Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse. IEEE Transactions on Applied Superconductivity, 19(3), 3483-3486. [5067186]. https://doi.org/10.1109/TASC.2009.2018734

Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse. / Ishiyama, Atsushi; Nishio, Yukiyasu; Ueda, Hiroshi; Kashima, Naoji; Mori, Masami; Watanabe, Tomonori; Nagaya, Shigeo; Yagi, Masashi; Mukoyama, Shinichi; Machi, Takato; Shiohara, Yuh.

In: IEEE Transactions on Applied Superconductivity, Vol. 19, No. 3, 5067186, 06.2009, p. 3483-3486.

Research output: Contribution to journalArticle

Ishiyama, A, Nishio, Y, Ueda, H, Kashima, N, Mori, M, Watanabe, T, Nagaya, S, Yagi, M, Mukoyama, S, Machi, T & Shiohara, Y 2009, 'Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse', IEEE Transactions on Applied Superconductivity, vol. 19, no. 3, 5067186, pp. 3483-3486. https://doi.org/10.1109/TASC.2009.2018734
Ishiyama, Atsushi ; Nishio, Yukiyasu ; Ueda, Hiroshi ; Kashima, Naoji ; Mori, Masami ; Watanabe, Tomonori ; Nagaya, Shigeo ; Yagi, Masashi ; Mukoyama, Shinichi ; Machi, Takato ; Shiohara, Yuh. / Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse. In: IEEE Transactions on Applied Superconductivity. 2009 ; Vol. 19, No. 3. pp. 3483-3486.
@article{5ef298f3676e4ef9a2387553142b271b,
title = "Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse",
abstract = "YBCO tapes are expected to be used in future high temperature superconducting (HTS) applications because of their good Jc characteristics at high temperatures and in high applied magnetic fields. In applications to electric power devices such as transmission cables, transformers, and fault current limiters, the HTS conductors will be subjected to short-circuit fault currents that are 10 to 30 times the normal operating current. These overcurrents are greater than the critical current, and degrade or burn-out the HTS conductors. Therefore, it is important to clarify the mechanism of the degradation caused by such overcurrent pulses. We carried out preliminary experiments on damage caused by overcurrent pulse drive, focusing on the temperature limitation without suffering degradation for overcurrent pulse operation. A 10-mm-wide YBCO tape was cut into 2-mm-wide sample tapes by a laser beam, and the sample tapes were soldered on silver-deposited 100-μm-thick copper plates. Overcurrent tests were carried out on these sample tapes and Ic degradation was investigated. In addition the contact interface between YBCO and the Ag layer or buffer layer before and after the overcurrent drives has been investigated in order to clarify the correlation between the degradation and delamination of sample tapes.",
keywords = "Degradation, Overcurrent pulse, Temperature limitation, YBCO tape",
author = "Atsushi Ishiyama and Yukiyasu Nishio and Hiroshi Ueda and Naoji Kashima and Masami Mori and Tomonori Watanabe and Shigeo Nagaya and Masashi Yagi and Shinichi Mukoyama and Takato Machi and Yuh Shiohara",
year = "2009",
month = "6",
doi = "10.1109/TASC.2009.2018734",
language = "English",
volume = "19",
pages = "3483--3486",
journal = "IEEE Transactions on Applied Superconductivity",
issn = "1051-8223",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "3",

}

TY - JOUR

T1 - Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse

AU - Ishiyama, Atsushi

AU - Nishio, Yukiyasu

AU - Ueda, Hiroshi

AU - Kashima, Naoji

AU - Mori, Masami

AU - Watanabe, Tomonori

AU - Nagaya, Shigeo

AU - Yagi, Masashi

AU - Mukoyama, Shinichi

AU - Machi, Takato

AU - Shiohara, Yuh

PY - 2009/6

Y1 - 2009/6

N2 - YBCO tapes are expected to be used in future high temperature superconducting (HTS) applications because of their good Jc characteristics at high temperatures and in high applied magnetic fields. In applications to electric power devices such as transmission cables, transformers, and fault current limiters, the HTS conductors will be subjected to short-circuit fault currents that are 10 to 30 times the normal operating current. These overcurrents are greater than the critical current, and degrade or burn-out the HTS conductors. Therefore, it is important to clarify the mechanism of the degradation caused by such overcurrent pulses. We carried out preliminary experiments on damage caused by overcurrent pulse drive, focusing on the temperature limitation without suffering degradation for overcurrent pulse operation. A 10-mm-wide YBCO tape was cut into 2-mm-wide sample tapes by a laser beam, and the sample tapes were soldered on silver-deposited 100-μm-thick copper plates. Overcurrent tests were carried out on these sample tapes and Ic degradation was investigated. In addition the contact interface between YBCO and the Ag layer or buffer layer before and after the overcurrent drives has been investigated in order to clarify the correlation between the degradation and delamination of sample tapes.

AB - YBCO tapes are expected to be used in future high temperature superconducting (HTS) applications because of their good Jc characteristics at high temperatures and in high applied magnetic fields. In applications to electric power devices such as transmission cables, transformers, and fault current limiters, the HTS conductors will be subjected to short-circuit fault currents that are 10 to 30 times the normal operating current. These overcurrents are greater than the critical current, and degrade or burn-out the HTS conductors. Therefore, it is important to clarify the mechanism of the degradation caused by such overcurrent pulses. We carried out preliminary experiments on damage caused by overcurrent pulse drive, focusing on the temperature limitation without suffering degradation for overcurrent pulse operation. A 10-mm-wide YBCO tape was cut into 2-mm-wide sample tapes by a laser beam, and the sample tapes were soldered on silver-deposited 100-μm-thick copper plates. Overcurrent tests were carried out on these sample tapes and Ic degradation was investigated. In addition the contact interface between YBCO and the Ag layer or buffer layer before and after the overcurrent drives has been investigated in order to clarify the correlation between the degradation and delamination of sample tapes.

KW - Degradation

KW - Overcurrent pulse

KW - Temperature limitation

KW - YBCO tape

UR - http://www.scopus.com/inward/record.url?scp=68749112503&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=68749112503&partnerID=8YFLogxK

U2 - 10.1109/TASC.2009.2018734

DO - 10.1109/TASC.2009.2018734

M3 - Article

AN - SCOPUS:68749112503

VL - 19

SP - 3483

EP - 3486

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

SN - 1051-8223

IS - 3

M1 - 5067186

ER -