Defects detection of eggplant fruit using multi spectral images

V. K. Chong, N. Kondo, K. Ninomiya, Mitsuji Monta, Kazuhiko Namba

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

An eggplant fruit grading machine system was developed and introduced at Okayama, 2002. However the color TV camera that has the sensitivity of 400-700 nm corresponding to human eyes has limitation in discriminating some defects on the eggplant fruits surface due to the characteristic of the defects that have very low colors contrast with normal surface. It is known that reflectance of most of fruit skins is much higher in near infrared spectrum than in visible spectrum. Photo-diodes used in CCD originally have high sensitivity till the near infrared spectrum. In this paper, the capability of color TV camera that has the sensitivity ranging from visible region to near infrared region was investigated for defects detection on eggplant fruit.

Original languageEnglish
Title of host publicationProceedings of the SICE Annual Conference
Pages2381-2384
Number of pages4
Publication statusPublished - 2005
EventSICE Annual Conference 2005 - Okayama, Japan
Duration: Aug 8 2005Aug 10 2005

Other

OtherSICE Annual Conference 2005
CountryJapan
CityOkayama
Period8/8/058/10/05

Fingerprint

Fruits
Color television
Infrared radiation
Cameras
Defects
Charge coupled devices
Skin
Diodes
Color
Defect detection

Keywords

  • Eggplant
  • Grading
  • Machine vision
  • Quality evaluation
  • Spectral reflectance
  • TV camera

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Chong, V. K., Kondo, N., Ninomiya, K., Monta, M., & Namba, K. (2005). Defects detection of eggplant fruit using multi spectral images. In Proceedings of the SICE Annual Conference (pp. 2381-2384)

Defects detection of eggplant fruit using multi spectral images. / Chong, V. K.; Kondo, N.; Ninomiya, K.; Monta, Mitsuji; Namba, Kazuhiko.

Proceedings of the SICE Annual Conference. 2005. p. 2381-2384.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chong, VK, Kondo, N, Ninomiya, K, Monta, M & Namba, K 2005, Defects detection of eggplant fruit using multi spectral images. in Proceedings of the SICE Annual Conference. pp. 2381-2384, SICE Annual Conference 2005, Okayama, Japan, 8/8/05.
Chong VK, Kondo N, Ninomiya K, Monta M, Namba K. Defects detection of eggplant fruit using multi spectral images. In Proceedings of the SICE Annual Conference. 2005. p. 2381-2384
Chong, V. K. ; Kondo, N. ; Ninomiya, K. ; Monta, Mitsuji ; Namba, Kazuhiko. / Defects detection of eggplant fruit using multi spectral images. Proceedings of the SICE Annual Conference. 2005. pp. 2381-2384
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