Defect detection method using deep convolutional neural network, support vector machine and template matching techniques

Fusaomi Nagata, Kenta Tokuno, Kazuki Mitarai, Akimasa Otsuka, Takeshi Ikeda, Hiroaki Ochi, Keigo Watanabe, Maki K. Habib

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

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