Deep sub-micron FD-SOI for front-end application

H. Ikeda, Y. Arai, K. Hara, H. Hayakawa, K. Hirose, Y. Ikegami, Hirokazu Ishino, Y. Kasaba, T. Kawasaki, T. Kohriki, E. Martin, H. Miyake, A. Mochizuki, H. Tajima, O. Tajima, T. Takahashi, T. Takashima, S. Terada, H. Tomita, T. TsuboyamaY. Unno, H. Ushiroda, G. Varner

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

In order to confirm benefits of a deep sub-micron FD-SOI and to identify possible issues concerning front-end circuits with the FD-SOI, we have submitted a small design to Oki Electric Industry Co., Ltd. via the multi-chip project service of VDEC, the University of Tokyo. The initial test results and future plans for development are presented.

Original languageEnglish
Pages (from-to)701-705
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume579
Issue number2 SPEC. ISS.
DOIs
Publication statusPublished - Sep 1 2007
Externally publishedYes

Fingerprint

Electric industry
SOI (semiconductors)
Networks (circuits)
industries
chips

Keywords

  • CMOS analog
  • Deep sub-micron CMOS
  • FD-SOI
  • Front-end
  • Radiation effect

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

Deep sub-micron FD-SOI for front-end application. / Ikeda, H.; Arai, Y.; Hara, K.; Hayakawa, H.; Hirose, K.; Ikegami, Y.; Ishino, Hirokazu; Kasaba, Y.; Kawasaki, T.; Kohriki, T.; Martin, E.; Miyake, H.; Mochizuki, A.; Tajima, H.; Tajima, O.; Takahashi, T.; Takashima, T.; Terada, S.; Tomita, H.; Tsuboyama, T.; Unno, Y.; Ushiroda, H.; Varner, G.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 579, No. 2 SPEC. ISS., 01.09.2007, p. 701-705.

Research output: Contribution to journalArticle

Ikeda, H, Arai, Y, Hara, K, Hayakawa, H, Hirose, K, Ikegami, Y, Ishino, H, Kasaba, Y, Kawasaki, T, Kohriki, T, Martin, E, Miyake, H, Mochizuki, A, Tajima, H, Tajima, O, Takahashi, T, Takashima, T, Terada, S, Tomita, H, Tsuboyama, T, Unno, Y, Ushiroda, H & Varner, G 2007, 'Deep sub-micron FD-SOI for front-end application', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 579, no. 2 SPEC. ISS., pp. 701-705. https://doi.org/10.1016/j.nima.2007.05.280
Ikeda, H. ; Arai, Y. ; Hara, K. ; Hayakawa, H. ; Hirose, K. ; Ikegami, Y. ; Ishino, Hirokazu ; Kasaba, Y. ; Kawasaki, T. ; Kohriki, T. ; Martin, E. ; Miyake, H. ; Mochizuki, A. ; Tajima, H. ; Tajima, O. ; Takahashi, T. ; Takashima, T. ; Terada, S. ; Tomita, H. ; Tsuboyama, T. ; Unno, Y. ; Ushiroda, H. ; Varner, G. / Deep sub-micron FD-SOI for front-end application. In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2007 ; Vol. 579, No. 2 SPEC. ISS. pp. 701-705.
@article{19a64e8ae4ae481ba94e7dab371f7638,
title = "Deep sub-micron FD-SOI for front-end application",
abstract = "In order to confirm benefits of a deep sub-micron FD-SOI and to identify possible issues concerning front-end circuits with the FD-SOI, we have submitted a small design to Oki Electric Industry Co., Ltd. via the multi-chip project service of VDEC, the University of Tokyo. The initial test results and future plans for development are presented.",
keywords = "CMOS analog, Deep sub-micron CMOS, FD-SOI, Front-end, Radiation effect",
author = "H. Ikeda and Y. Arai and K. Hara and H. Hayakawa and K. Hirose and Y. Ikegami and Hirokazu Ishino and Y. Kasaba and T. Kawasaki and T. Kohriki and E. Martin and H. Miyake and A. Mochizuki and H. Tajima and O. Tajima and T. Takahashi and T. Takashima and S. Terada and H. Tomita and T. Tsuboyama and Y. Unno and H. Ushiroda and G. Varner",
year = "2007",
month = "9",
day = "1",
doi = "10.1016/j.nima.2007.05.280",
language = "English",
volume = "579",
pages = "701--705",
journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",
issn = "0168-9002",
publisher = "Elsevier",
number = "2 SPEC. ISS.",

}

TY - JOUR

T1 - Deep sub-micron FD-SOI for front-end application

AU - Ikeda, H.

AU - Arai, Y.

AU - Hara, K.

AU - Hayakawa, H.

AU - Hirose, K.

AU - Ikegami, Y.

AU - Ishino, Hirokazu

AU - Kasaba, Y.

AU - Kawasaki, T.

AU - Kohriki, T.

AU - Martin, E.

AU - Miyake, H.

AU - Mochizuki, A.

AU - Tajima, H.

AU - Tajima, O.

AU - Takahashi, T.

AU - Takashima, T.

AU - Terada, S.

AU - Tomita, H.

AU - Tsuboyama, T.

AU - Unno, Y.

AU - Ushiroda, H.

AU - Varner, G.

PY - 2007/9/1

Y1 - 2007/9/1

N2 - In order to confirm benefits of a deep sub-micron FD-SOI and to identify possible issues concerning front-end circuits with the FD-SOI, we have submitted a small design to Oki Electric Industry Co., Ltd. via the multi-chip project service of VDEC, the University of Tokyo. The initial test results and future plans for development are presented.

AB - In order to confirm benefits of a deep sub-micron FD-SOI and to identify possible issues concerning front-end circuits with the FD-SOI, we have submitted a small design to Oki Electric Industry Co., Ltd. via the multi-chip project service of VDEC, the University of Tokyo. The initial test results and future plans for development are presented.

KW - CMOS analog

KW - Deep sub-micron CMOS

KW - FD-SOI

KW - Front-end

KW - Radiation effect

UR - http://www.scopus.com/inward/record.url?scp=34547755613&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34547755613&partnerID=8YFLogxK

U2 - 10.1016/j.nima.2007.05.280

DO - 10.1016/j.nima.2007.05.280

M3 - Article

AN - SCOPUS:34547755613

VL - 579

SP - 701

EP - 705

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

SN - 0168-9002

IS - 2 SPEC. ISS.

ER -