De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements

Kazuki Maeda, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
Original languageEnglish
Title of host publicationProceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009
Pages246-249
Number of pages4
DOIs
Publication statusPublished - Dec 1 2009
EventAsia-Pacific Conference on Environmental Electromagnetics, CEEM'2009 - Xi'an, China
Duration: Sep 16 2009Sep 20 2009

Publication series

NameProceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009

Other

OtherAsia-Pacific Conference on Environmental Electromagnetics, CEEM'2009
CountryChina
CityXi'an
Period9/16/099/20/09

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Maeda, K., Iokibe, K., Toyota, Y., & Koga, R. (2009). De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements. In Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009 (pp. 246-249). [5303985] (Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009). https://doi.org/10.1109/CEEM.2009.5303985