De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements

Kazuki Maeda, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
Original languageEnglish
Title of host publicationProceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009
Pages246-249
Number of pages4
DOIs
Publication statusPublished - 2009
EventAsia-Pacific Conference on Environmental Electromagnetics, CEEM'2009 - Xi'an, China
Duration: Sep 16 2009Sep 20 2009

Other

OtherAsia-Pacific Conference on Environmental Electromagnetics, CEEM'2009
CountryChina
CityXi'an
Period9/16/099/20/09

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Scattering parameters
Polychlorinated biphenyls
Integrated circuits

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Maeda, K., Iokibe, K., Toyota, Y., & Koga, R. (2009). De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements. In Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009 (pp. 246-249). [5303985] https://doi.org/10.1109/CEEM.2009.5303985

De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements. / Maeda, Kazuki; Iokibe, Kengo; Toyota, Yoshitaka; Koga, Ryuji.

Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009. 2009. p. 246-249 5303985.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Maeda, K, Iokibe, K, Toyota, Y & Koga, R 2009, De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements. in Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009., 5303985, pp. 246-249, Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009, Xi'an, China, 9/16/09. https://doi.org/10.1109/CEEM.2009.5303985
Maeda, Kazuki ; Iokibe, Kengo ; Toyota, Yoshitaka ; Koga, Ryuji. / De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB - Examinations in one-port measurements. Proceedings - Asia-Pacific Conference on Environmental Electromagnetics, CEEM'2009. 2009. pp. 246-249
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