Dark current reduction in stacked-type CMOS-APS for charged particle imaging

    Research output: Contribution to journalArticle

    21 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)70-76
    Number of pages7
    JournalIEEE Trans. Electron Devices
    Volume50
    Publication statusPublished - 2003

    Cite this

    Dark current reduction in stacked-type CMOS-APS for charged particle imaging. / Kunihiro, Takuya.

    In: IEEE Trans. Electron Devices, Vol. 50, 2003, p. 70-76.

    Research output: Contribution to journalArticle

    @article{14b351eba1214067b055594d08cb63af,
    title = "Dark current reduction in stacked-type CMOS-APS for charged particle imaging",
    author = "Takuya Kunihiro",
    year = "2003",
    language = "English",
    volume = "50",
    pages = "70--76",
    journal = "IEEE Trans. Electron Devices",

    }

    TY - JOUR

    T1 - Dark current reduction in stacked-type CMOS-APS for charged particle imaging

    AU - Kunihiro, Takuya

    PY - 2003

    Y1 - 2003

    M3 - Article

    VL - 50

    SP - 70

    EP - 76

    JO - IEEE Trans. Electron Devices

    JF - IEEE Trans. Electron Devices

    ER -