Crystal structure analysis under uniaxial strain at low temperature using a unique design of four-axis x-ray diffractometer with a fixed sample

Ryusuke Kondo, Seiichi Kagoshima, Jimpei Harada

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64 Citations (Scopus)

Abstract

For the purpose of crystal structure analysis under uniaxial strain at low temperatures, we developed a pressure cell for uniaxial compression and a unique design of an x-ray diffractometer wherein both the x-ray source and the detector are capable of two-axial rotation with a fixed sample. This arrangement is advantageous to crystal structure analyses under extreme conditions that require a large and heavy apparatus. Using the present diffractometer, we performed the crystal structure analyses of the organic conductor, α- (BEDT-TTF)2 I3 (BEDT-TTF denotes bis(ethylene)dithio-tetrathiafulvalene), under uniaxial strain and ambient pressure, and at room and low temperatures, and obtained results that were qualitatively consistent with those of resistivity measurements.

Original languageEnglish
Article number093902
JournalReview of Scientific Instruments
Volume76
Issue number9
DOIs
Publication statusPublished - Sep 2005
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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