Critical current density and related microstructures of TFA-MOD YBCO coated conductors

Y. Yamada, S. B. Kim, T. Araki, Y. Takahashi, T. Yuasa, H. Kurosaki, I. Hirabayashi, Y. Iijima, K. Takeda

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19 Citations (Scopus)

Abstract

Metalorganic deposition process using trifluoroacetate (TFA-MOD) processed YBCO film on LaAlO3 and IBAD (YSZ/Hastelloy) substrate exhibited high critical current density, Jc, at 77.3 K. The obtained Jc values at 0 T were 7 and 1.7 MA/cm2 for LaAlO3 and CeO2 buffered IBAD, respectively. High Jc values over 105 A/cm2 were maintained up to 4 T (B∥c-axis) for the LaAlO3 substrate and up to 3 T (B∥c-axis) for the CeO2 buffered IBAD substrate. These results imply that TFA-MOD with simple fabrication process is very promising for the practical YBCO coated conductor.

Original languageEnglish
Pages (from-to)1007-1010
Number of pages4
JournalPhysica C: Superconductivity and its applications
Volume357-360
DOIs
Publication statusPublished - Sep 2001
Externally publishedYes

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Keywords

  • Coated conductor
  • Critical current density
  • TFA-MOD
  • YBCO

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this

Yamada, Y., Kim, S. B., Araki, T., Takahashi, Y., Yuasa, T., Kurosaki, H., Hirabayashi, I., Iijima, Y., & Takeda, K. (2001). Critical current density and related microstructures of TFA-MOD YBCO coated conductors. Physica C: Superconductivity and its applications, 357-360, 1007-1010. https://doi.org/10.1016/S0921-4534(01)00471-3