Coordination environment of silicon in silica glass up to 74 GPa: An x-ray Raman scattering study at the silicon L edge

Hiroshi Fukui, Masami Kanzaki, Nozomu Hiraoka, Yong Q. Cai

Research output: Contribution to journalArticle

34 Citations (Scopus)

Abstract

Near-edge x-ray Raman scattering (XRS) spectra of the silicon L edge have been obtained on SiO2 glass under compression in a diamond anvil cell up to 74 GPa. Partial densities of states (DOS's) of electrons, which the spectra reflect, have been calculated. The spectra for the glass do not show significant variations with pressure, whereas distinct differences are observed between quartz and stishovite, providing clear evidence for the nonexistence of sixfold-coordinated silicon by oxygen, that is stishovitelike silicon, in silica glass up to 74 GPa. A post main-edge hump, which is not seen in the XRS spectra and DOS's of quartz and stishovite, and an edge energy shift suggest that the silicon is in a different coordination environment under pressure. A compression mechanism of SiO2 glass which involves the formation of fivefold-coordinated silicon following the decrease in Si-O-Si angle is proposed to explain the observed changes up to 74 GPa.

Original languageEnglish
Article number012203
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume78
Issue number1
DOIs
Publication statusPublished - Jul 21 2008

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silica glass
Silicon
Fused silica
x ray scattering
Raman scattering
Raman spectra
X rays
stishovite
silicon
Quartz
Glass
glass
Compaction
quartz
Diamond
anvils
Diamonds
diamonds
Oxygen
Electrons

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Coordination environment of silicon in silica glass up to 74 GPa : An x-ray Raman scattering study at the silicon L edge. / Fukui, Hiroshi; Kanzaki, Masami; Hiraoka, Nozomu; Cai, Yong Q.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 78, No. 1, 012203, 21.07.2008.

Research output: Contribution to journalArticle

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