Constitutive equations of bauschinger effect under stress path changes

T. Uemori, S. Sumikawa, S. Tamura, H. Hamasaki, T. Naka, R. Hino, F. Yoshida

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

It Is widely known that the modelling of Bauschinger effect is one of key points to conduct the accurate sheet metal stamping. The elasto- plasticity behaviour of aluminium alloy steel sheet was investigated by conducting uniaxial compression tension tests in the different angle from the prestraining test. In order to evaluate the accuracy of constitutive models for describing the above mentioned complex elasto- plasticity behaviour, numerical calculations of stress-strain responses were conducted for the corresponding stress paths of the experimental data by using three kinds of constitutive models: the isotropic hardening model (hereafter IH model), Yoshida-Uemori model and the modified Yoshida-Uemori kinematic hardening model. The author's present constitutive model was verified by comparing the stress strain responses with the above mentioned stress-strain histories.

Original languageEnglish
Title of host publicationSpecial Edition
Subtitle of host publication10th International Conference on Technology of Plasticity, ICTP 2011
Pages819-823
Number of pages5
Publication statusPublished - Dec 1 2011
Externally publishedYes
Event10th International Conference on Technology of Plasticity, ICTP 2011 - Aachen, Germany
Duration: Sep 25 2011Sep 30 2011

Publication series

NameSpecial Edition: 10th International Conference on Technology of Plasticity, ICTP 2011

Other

Other10th International Conference on Technology of Plasticity, ICTP 2011
CountryGermany
CityAachen
Period9/25/119/30/11

Keywords

  • Bauschinger effect
  • Constitutive model
  • Stress path changes

ASJC Scopus subject areas

  • Polymers and Plastics

Fingerprint Dive into the research topics of 'Constitutive equations of bauschinger effect under stress path changes'. Together they form a unique fingerprint.

Cite this