Conductive atomic force microscopy of chemically synthesized graphene oxide and interlayer conduction

Yoshio Kanamori, Seiji Obata, Koichiro Saiki

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Graphene oxide, a chemically modified graphene, has been attracting wide attention because of promising adaptability to a wide variety of applications. However, the properties of graphene oxide itself are not known well. Using a conductive cantilever, we observed a current image of graphene oxide nanosheets of various thicknesses. Currentvoltage characteristics were found to reflect the local conductivity normal to the nanosheets. Under high electric fields, the conduction was well described in terms of PooleFrenkel emission mechanism. The fitting of IV curves to the PooleFrenkel model provides information on dielectric properties, and the relative permittivity of graphene oxide was found to be 4.8 ± 0.8.

Original languageEnglish
Pages (from-to)255-257
Number of pages3
JournalChemistry Letters
Volume40
Issue number3
DOIs
Publication statusPublished - Feb 28 2011
Externally publishedYes

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Graphite
Oxides
Atomic force microscopy
Nanosheets
Dielectric properties
Permittivity
Electric fields

ASJC Scopus subject areas

  • Chemistry(all)

Cite this

Conductive atomic force microscopy of chemically synthesized graphene oxide and interlayer conduction. / Kanamori, Yoshio; Obata, Seiji; Saiki, Koichiro.

In: Chemistry Letters, Vol. 40, No. 3, 28.02.2011, p. 255-257.

Research output: Contribution to journalArticle

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