Coherent X-ray diffraction for domain observation II

K. Ohwada, D. Shimizu, J. Mizuki, K. Fujiwara, T. Nagata, N. Ikeda, H. Ohwa, N. Yasuda, K. Namikawa

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The CXD method have been shown to be applicable to the crystal characterization as well as the domain observation. The present CXD technique could evaluate the crystal coherence length up to 10 μm and the wide variety of samples were chosen in this study. We have shown how the ideal Bragg reflection deforms as the disorder and the defects increases and form the speckle patterns, the typical scattering patterns of CXD, by changing the samples. Finally we have successfully observed the μm/sub-μm domain arrangements in LuFe2O4/(1−x)Pb(Zn1/3Nb2/3)O3-xPbTiO3 (x = 0.09), where it is hard to be observed by the conventional diffraction techniques.

Original languageEnglish
Pages (from-to)16-21
Number of pages6
JournalFerroelectrics
Volume513
Issue number1
DOIs
Publication statusPublished - Jun 11 2017

Keywords

  • Coherent X-ray diffraction
  • domain
  • ferroelectrics

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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    Ohwada, K., Shimizu, D., Mizuki, J., Fujiwara, K., Nagata, T., Ikeda, N., Ohwa, H., Yasuda, N., & Namikawa, K. (2017). Coherent X-ray diffraction for domain observation II. Ferroelectrics, 513(1), 16-21. https://doi.org/10.1080/00150193.2017.1350058