Abstract
This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.
| Original language | English |
|---|---|
| Pages (from-to) | 551-556 |
| Number of pages | 6 |
| Journal | IEICE Transactions on Information and Systems |
| Volume | E87-D |
| Issue number | 3 |
| Publication status | Published - Mar 2004 |
Keywords
- Current test
- Defect detection
- Floating gate defect
- Open defect
ASJC Scopus subject areas
- Software
- Hardware and Architecture
- Computer Vision and Pattern Recognition
- Electrical and Electronic Engineering
- Artificial Intelligence
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Cite this
Michinishi, H., Yokohira, T., Okamoto, T., Kobayashi, T., & Hondo, T. (2004). CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. IEICE Transactions on Information and Systems, E87-D(3), 551-556.