CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component

Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Toshifumi Kobayashi; Tsutomu Hondo

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

Research output: Contribution to journal › Article › peer-review

Abstract

This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.

Original language	English
Pages (from-to)	551-556
Number of pages	6
Journal	IEICE Transactions on Information and Systems
Volume	E87-D
Issue number	3
Publication status	Published - Mar 2004

Keywords

Current test
Defect detection
Floating gate defect
Open defect

ASJC Scopus subject areas

Software
Hardware and Architecture
Computer Vision and Pattern Recognition
Electrical and Electronic Engineering
Artificial Intelligence

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Cite this

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title = "CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component",

abstract = "This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.",

keywords = "Current test, Defect detection, Floating gate defect, Open defect",

author = "Hiroyuki Michinishi and Tokumi Yokohira and Takuji Okamoto and Toshifumi Kobayashi and Tsutomu Hondo",

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TY - JOUR

T1 - CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component

AU - Michinishi, Hiroyuki

AU - Yokohira, Tokumi

AU - Okamoto, Takuji

AU - Kobayashi, Toshifumi

AU - Hondo, Tsutomu

PY - 2004/3

Y1 - 2004/3

N2 - This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.

AB - This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.

KW - Current test

KW - Defect detection

KW - Floating gate defect

KW - Open defect

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