CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.

Original languageEnglish
Pages (from-to)551-556
Number of pages6
JournalIEICE Transactions on Information and Systems
VolumeE87-D
Issue number3
Publication statusPublished - Mar 2004

Keywords

  • Current test
  • Defect detection
  • Floating gate defect
  • Open defect

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence

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