Abstract
This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.
| Original language | English |
|---|---|
| Pages (from-to) | 551-556 |
| Number of pages | 6 |
| Journal | IEICE Transactions on Information and Systems |
| Volume | E87-D |
| Issue number | 3 |
| Publication status | Published - Mar 2004 |
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Keywords
- Current test
- Defect detection
- Floating gate defect
- Open defect
ASJC Scopus subject areas
- Information Systems
- Computer Graphics and Computer-Aided Design
- Software
Cite this
CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. / Michinishi, Hiroyuki; Yokohira, Tokumi; Okamoto, Takuji; Kobayashi, Toshifumi; Hondo, Tsutomu.
In: IEICE Transactions on Information and Systems, Vol. E87-D, No. 3, 03.2004, p. 551-556.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component
AU - Michinishi, Hiroyuki
AU - Yokohira, Tokumi
AU - Okamoto, Takuji
AU - Kobayashi, Toshifumi
AU - Hondo, Tsutomu
PY - 2004/3
Y1 - 2004/3
N2 - This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.
AB - This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.
KW - Current test
KW - Defect detection
KW - Floating gate defect
KW - Open defect
UR - http://www.scopus.com/inward/record.url?scp=1642346568&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=1642346568&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:1642346568
VL - E87-D
SP - 551
EP - 556
JO - IEICE Transactions on Information and Systems
JF - IEICE Transactions on Information and Systems
SN - 0916-8532
IS - 3
ER -