CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.

Original languageEnglish
Pages (from-to)551-556
Number of pages6
JournalIEICE Transactions on Information and Systems
VolumeE87-D
Issue number3
Publication statusPublished - Mar 2004

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Defects
Defect detection
Experiments

Keywords

  • Current test
  • Defect detection
  • Floating gate defect
  • Open defect

ASJC Scopus subject areas

  • Information Systems
  • Computer Graphics and Computer-Aided Design
  • Software

Cite this

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. / Michinishi, Hiroyuki; Yokohira, Tokumi; Okamoto, Takuji; Kobayashi, Toshifumi; Hondo, Tsutomu.

In: IEICE Transactions on Information and Systems, Vol. E87-D, No. 3, 03.2004, p. 551-556.

Research output: Contribution to journalArticle

Michinishi, Hiroyuki ; Yokohira, Tokumi ; Okamoto, Takuji ; Kobayashi, Toshifumi ; Hondo, Tsutomu. / CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. In: IEICE Transactions on Information and Systems. 2004 ; Vol. E87-D, No. 3. pp. 551-556.
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