@inproceedings{b8725723db7f45659eefc1ac10352264,
title = "CMOS floating gate defect detection using IDDQ test with DC power supply superposed by AC component",
abstract = "In this paper, we propose a new IDDQ test method for detecting floating gate defects in CMOS ICs. In the method, an unusual increase of the supply current, caused by defects, is promoted by superposing an AC component on the DC power supply. The feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional IDDQ test.",
keywords = "CMOS logic circuits, Current supplies, Electronic equipment testing, Electronics industry, Gas detectors, Inverters, Logic testing, Power engineering and energy, Power supplies, Voltage",
author = "H. Michinishi and T. Yokohira and T. Okamoto and T. Kobayashi and T. Hondo",
note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; 11th Asian Test Symposium, ATS 2002 ; Conference date: 18-11-2002 Through 20-11-2002",
year = "2002",
doi = "10.1109/ATS.2002.1181747",
language = "English",
series = "Proceedings of the Asian Test Symposium",
publisher = "IEEE Computer Society",
pages = "417--422",
booktitle = "Proceedings of the 11th Asian Test Symposium, ATS 2002",
address = "United States",
}