Chemical shifts of silicon X-ray photoelectron spectra by polymerization structures of silicates

Kiyoshi Okada, Yoshikazu Kameshima, Atsuo Yasumori

Research output: Contribution to journalArticle

69 Citations (Scopus)

Abstract

The binding energy of Si 2p electrons and the kinetic energy of the Si(KLL) X-ray-excited state were measured by using X-ray photoelectron spectroscopy (XPS) and X-ray Auger electron spectroscopy (XAES), respectively, for silicates with SiO4 tetrahedra of various polymerization types. The resulting Si 2p XPS binding energies varied from 101.3 eV in merwinite (monomeric structure) to 103.4 eV in quartz and cristobalite (three-dimensional framework structure). A clear chemical-shift relation was observed, relating the polymerization structures of SiO4 tetrahedra to the plots of their Si 2p XPS binding energy versus the kinetic energy of their Si(KLL) XAES spectra. Thus, the structural state of the surface silicates in various substances can be deduced from this chemical-shift relationship.

Original languageEnglish
Pages (from-to)1970-1972
Number of pages3
JournalJournal of the American Ceramic Society
Volume81
Issue number7
DOIs
Publication statusPublished - Jul 1998
Externally publishedYes

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

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