Chemical shifts of silicon X-ray photoelectron spectra by polymerization structures of silicates

Kiyoshi Okada, Yoshikazu Kameshima, Atsuo Yasumori

Research output: Contribution to journalArticle

63 Citations (Scopus)

Abstract

The binding energy of Si 2p electrons and the kinetic energy of the Si(KLL) X-ray-excited state were measured by using X-ray photoelectron spectroscopy (XPS) and X-ray Auger electron spectroscopy (XAES), respectively, for silicates with SiO 4 tetrahedra of various polymerization types. The resulting Si 2p XPS binding energies varied from 101.3 eV in merwinite (monomeric structure) to 103.4 eV in quartz and cristobalite (three-dimensional framework structure). A clear chemical-shift relation was observed, relating the polymerization structures of SiO 4 tetrahedra to the plots of their Si 2p XPS binding energy versus the kinetic energy of their Si(KLL) XAES spectra. Thus, the structural state of the surface silicates in various substances can be deduced from this chemical-shift relationship.

Original languageEnglish
Pages (from-to)1970-1972
Number of pages3
JournalJournal of the American Ceramic Society
Volume81
Issue number7
Publication statusPublished - Jul 1998
Externally publishedYes

Fingerprint

Silicates
Chemical shift
Silicon
Photoelectrons
Binding energy
X ray photoelectron spectroscopy
Polymerization
Auger electron spectroscopy
Kinetic energy
X rays
Quartz
Excited states
Silicon Dioxide
Electrons

ASJC Scopus subject areas

  • Ceramics and Composites

Cite this

Chemical shifts of silicon X-ray photoelectron spectra by polymerization structures of silicates. / Okada, Kiyoshi; Kameshima, Yoshikazu; Yasumori, Atsuo.

In: Journal of the American Ceramic Society, Vol. 81, No. 7, 07.1998, p. 1970-1972.

Research output: Contribution to journalArticle

@article{319481620e93419186fd06e223cb8d46,
title = "Chemical shifts of silicon X-ray photoelectron spectra by polymerization structures of silicates",
abstract = "The binding energy of Si 2p electrons and the kinetic energy of the Si(KLL) X-ray-excited state were measured by using X-ray photoelectron spectroscopy (XPS) and X-ray Auger electron spectroscopy (XAES), respectively, for silicates with SiO 4 tetrahedra of various polymerization types. The resulting Si 2p XPS binding energies varied from 101.3 eV in merwinite (monomeric structure) to 103.4 eV in quartz and cristobalite (three-dimensional framework structure). A clear chemical-shift relation was observed, relating the polymerization structures of SiO 4 tetrahedra to the plots of their Si 2p XPS binding energy versus the kinetic energy of their Si(KLL) XAES spectra. Thus, the structural state of the surface silicates in various substances can be deduced from this chemical-shift relationship.",
author = "Kiyoshi Okada and Yoshikazu Kameshima and Atsuo Yasumori",
year = "1998",
month = "7",
language = "English",
volume = "81",
pages = "1970--1972",
journal = "Journal of the American Ceramic Society",
issn = "0002-7820",
publisher = "Wiley-Blackwell",
number = "7",

}

TY - JOUR

T1 - Chemical shifts of silicon X-ray photoelectron spectra by polymerization structures of silicates

AU - Okada, Kiyoshi

AU - Kameshima, Yoshikazu

AU - Yasumori, Atsuo

PY - 1998/7

Y1 - 1998/7

N2 - The binding energy of Si 2p electrons and the kinetic energy of the Si(KLL) X-ray-excited state were measured by using X-ray photoelectron spectroscopy (XPS) and X-ray Auger electron spectroscopy (XAES), respectively, for silicates with SiO 4 tetrahedra of various polymerization types. The resulting Si 2p XPS binding energies varied from 101.3 eV in merwinite (monomeric structure) to 103.4 eV in quartz and cristobalite (three-dimensional framework structure). A clear chemical-shift relation was observed, relating the polymerization structures of SiO 4 tetrahedra to the plots of their Si 2p XPS binding energy versus the kinetic energy of their Si(KLL) XAES spectra. Thus, the structural state of the surface silicates in various substances can be deduced from this chemical-shift relationship.

AB - The binding energy of Si 2p electrons and the kinetic energy of the Si(KLL) X-ray-excited state were measured by using X-ray photoelectron spectroscopy (XPS) and X-ray Auger electron spectroscopy (XAES), respectively, for silicates with SiO 4 tetrahedra of various polymerization types. The resulting Si 2p XPS binding energies varied from 101.3 eV in merwinite (monomeric structure) to 103.4 eV in quartz and cristobalite (three-dimensional framework structure). A clear chemical-shift relation was observed, relating the polymerization structures of SiO 4 tetrahedra to the plots of their Si 2p XPS binding energy versus the kinetic energy of their Si(KLL) XAES spectra. Thus, the structural state of the surface silicates in various substances can be deduced from this chemical-shift relationship.

UR - http://www.scopus.com/inward/record.url?scp=0032114773&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032114773&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0032114773

VL - 81

SP - 1970

EP - 1972

JO - Journal of the American Ceramic Society

JF - Journal of the American Ceramic Society

SN - 0002-7820

IS - 7

ER -