Abstract
X-ray reflective measurements (XRR), atomic force microscopy and single wavelength ellipsometry were used to investigate the optical properties of thin l-leucine films deposited onto silicon substrates. The ellipsometry data (Ψ,Δ) were fitted with a four-layer-model, and the optical refractive index of the l-leucine film measured with ellipsometry was determined to be 1.37. With the conventional effective medium approximation theory and the ellipsometry results, the density of the l-leucine nanofilm was determined to be 70% (0.81 g/cm3) of crystalline l-leucine. This value was in good agreement with the density of 69% (0.80 g/cm3) obtained with XRR measurement. The ellipsometry measurements also enabled us to estimate the surface roughness or absorption layer of the film. This procedure of combined XRR and ellipsometry measurements could be a powerful tool for the determination of the (otherwise hard-to-determine) refractive index in thin organic material films with a rough surface layer.
| Original language | English |
|---|---|
| Pages (from-to) | 1993-1997 |
| Number of pages | 5 |
| Journal | Thin Solid Films |
| Volume | 519 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - Jan 3 2011 |
| Externally published | Yes |
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Keywords
- Amino acid
- Optical properties
- Surface roughness
- X-ray reflective analysis
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Metals and Alloys
- Surfaces, Coatings and Films
- Surfaces and Interfaces
Cite this
Characterization of vapor-deposited l-leucine nanofilm. / Hada, Masaki; Ichiki, Kazuya; Matsuo, Jiro.
In: Thin Solid Films, Vol. 519, No. 6, 03.01.2011, p. 1993-1997.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Characterization of vapor-deposited l-leucine nanofilm
AU - Hada, Masaki
AU - Ichiki, Kazuya
AU - Matsuo, Jiro
PY - 2011/1/3
Y1 - 2011/1/3
N2 - X-ray reflective measurements (XRR), atomic force microscopy and single wavelength ellipsometry were used to investigate the optical properties of thin l-leucine films deposited onto silicon substrates. The ellipsometry data (Ψ,Δ) were fitted with a four-layer-model, and the optical refractive index of the l-leucine film measured with ellipsometry was determined to be 1.37. With the conventional effective medium approximation theory and the ellipsometry results, the density of the l-leucine nanofilm was determined to be 70% (0.81 g/cm3) of crystalline l-leucine. This value was in good agreement with the density of 69% (0.80 g/cm3) obtained with XRR measurement. The ellipsometry measurements also enabled us to estimate the surface roughness or absorption layer of the film. This procedure of combined XRR and ellipsometry measurements could be a powerful tool for the determination of the (otherwise hard-to-determine) refractive index in thin organic material films with a rough surface layer.
AB - X-ray reflective measurements (XRR), atomic force microscopy and single wavelength ellipsometry were used to investigate the optical properties of thin l-leucine films deposited onto silicon substrates. The ellipsometry data (Ψ,Δ) were fitted with a four-layer-model, and the optical refractive index of the l-leucine film measured with ellipsometry was determined to be 1.37. With the conventional effective medium approximation theory and the ellipsometry results, the density of the l-leucine nanofilm was determined to be 70% (0.81 g/cm3) of crystalline l-leucine. This value was in good agreement with the density of 69% (0.80 g/cm3) obtained with XRR measurement. The ellipsometry measurements also enabled us to estimate the surface roughness or absorption layer of the film. This procedure of combined XRR and ellipsometry measurements could be a powerful tool for the determination of the (otherwise hard-to-determine) refractive index in thin organic material films with a rough surface layer.
KW - Amino acid
KW - Optical properties
KW - Surface roughness
KW - X-ray reflective analysis
UR - http://www.scopus.com/inward/record.url?scp=78651227106&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=78651227106&partnerID=8YFLogxK
U2 - 10.1016/j.tsf.2010.10.011
DO - 10.1016/j.tsf.2010.10.011
M3 - Article
AN - SCOPUS:78651227106
VL - 519
SP - 1993
EP - 1997
JO - Thin Solid Films
JF - Thin Solid Films
SN - 0040-6090
IS - 6
ER -