Characterization of Surface‐Oxidized Phase in Silicon Nitride and Silicon Oxynitride Powders by X‐ray Photoelectron Spectroscopy

Kiyoshi Okada, Koyo Fukuyama, Yoshikazu Kameshima

Research output: Contribution to journalArticle

40 Citations (Scopus)

Abstract

Surface‐oxidized phases on α‐silicon nitride, β‐silicon nitride, and silicon oxynitride powders were investigated by X‐ray photoelectron spectroscopy (XPS) and X‐ray Auger electron spectroscopy (XAES). The spectra of Si2p XPS and Si(KLL) XAES were measured precisely and were deconvoluted into some separate peaks, which correspond to each parent phase, a SiOxNy, oxidized phase, a nonstoichiometric SiNx. nitride phase, and a satellite peak of the parent phase, by the least‐squares method. The Auger parameter (AP) was calculated for each phase using the Si2p XPS and Si(KLL) XAES data, and the average chemical compositions of the oxidized phases in each sample were evaluated from the AP data. The chemical compositions of these phases were between those of silica and silicon oxynitride and varied among the samples, but were usually close to SiO2. Average thicknesses of the surface‐oxidized phases were estimated to be 0.1–0.8 nm from the peak area ratio of the oxidized phase against the parent phase of the XAES spectra, assuming a continuous surface layer model.

Original languageEnglish
Pages (from-to)2021-2026
Number of pages6
JournalJournal of the American Ceramic Society
Volume78
Issue number8
DOIs
Publication statusPublished - 1995
Externally publishedYes

Fingerprint

Silicon
Auger electron spectroscopy
Photoelectron spectroscopy
Silicon nitride
Powders
Chemical analysis
Nitrides
Silicon Dioxide
Silica
Satellites
silicon nitride

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

Cite this

@article{ff19d6949b1343a595c7e4a4756714d5,
title = "Characterization of Surface‐Oxidized Phase in Silicon Nitride and Silicon Oxynitride Powders by X‐ray Photoelectron Spectroscopy",
abstract = "Surface‐oxidized phases on α‐silicon nitride, β‐silicon nitride, and silicon oxynitride powders were investigated by X‐ray photoelectron spectroscopy (XPS) and X‐ray Auger electron spectroscopy (XAES). The spectra of Si2p XPS and Si(KLL) XAES were measured precisely and were deconvoluted into some separate peaks, which correspond to each parent phase, a SiOxNy, oxidized phase, a nonstoichiometric SiNx. nitride phase, and a satellite peak of the parent phase, by the least‐squares method. The Auger parameter (AP) was calculated for each phase using the Si2p XPS and Si(KLL) XAES data, and the average chemical compositions of the oxidized phases in each sample were evaluated from the AP data. The chemical compositions of these phases were between those of silica and silicon oxynitride and varied among the samples, but were usually close to SiO2. Average thicknesses of the surface‐oxidized phases were estimated to be 0.1–0.8 nm from the peak area ratio of the oxidized phase against the parent phase of the XAES spectra, assuming a continuous surface layer model.",
author = "Kiyoshi Okada and Koyo Fukuyama and Yoshikazu Kameshima",
year = "1995",
doi = "10.1111/j.1151-2916.1995.tb08613.x",
language = "English",
volume = "78",
pages = "2021--2026",
journal = "Journal of the American Ceramic Society",
issn = "0002-7820",
publisher = "Wiley-Blackwell",
number = "8",

}

TY - JOUR

T1 - Characterization of Surface‐Oxidized Phase in Silicon Nitride and Silicon Oxynitride Powders by X‐ray Photoelectron Spectroscopy

AU - Okada, Kiyoshi

AU - Fukuyama, Koyo

AU - Kameshima, Yoshikazu

PY - 1995

Y1 - 1995

N2 - Surface‐oxidized phases on α‐silicon nitride, β‐silicon nitride, and silicon oxynitride powders were investigated by X‐ray photoelectron spectroscopy (XPS) and X‐ray Auger electron spectroscopy (XAES). The spectra of Si2p XPS and Si(KLL) XAES were measured precisely and were deconvoluted into some separate peaks, which correspond to each parent phase, a SiOxNy, oxidized phase, a nonstoichiometric SiNx. nitride phase, and a satellite peak of the parent phase, by the least‐squares method. The Auger parameter (AP) was calculated for each phase using the Si2p XPS and Si(KLL) XAES data, and the average chemical compositions of the oxidized phases in each sample were evaluated from the AP data. The chemical compositions of these phases were between those of silica and silicon oxynitride and varied among the samples, but were usually close to SiO2. Average thicknesses of the surface‐oxidized phases were estimated to be 0.1–0.8 nm from the peak area ratio of the oxidized phase against the parent phase of the XAES spectra, assuming a continuous surface layer model.

AB - Surface‐oxidized phases on α‐silicon nitride, β‐silicon nitride, and silicon oxynitride powders were investigated by X‐ray photoelectron spectroscopy (XPS) and X‐ray Auger electron spectroscopy (XAES). The spectra of Si2p XPS and Si(KLL) XAES were measured precisely and were deconvoluted into some separate peaks, which correspond to each parent phase, a SiOxNy, oxidized phase, a nonstoichiometric SiNx. nitride phase, and a satellite peak of the parent phase, by the least‐squares method. The Auger parameter (AP) was calculated for each phase using the Si2p XPS and Si(KLL) XAES data, and the average chemical compositions of the oxidized phases in each sample were evaluated from the AP data. The chemical compositions of these phases were between those of silica and silicon oxynitride and varied among the samples, but were usually close to SiO2. Average thicknesses of the surface‐oxidized phases were estimated to be 0.1–0.8 nm from the peak area ratio of the oxidized phase against the parent phase of the XAES spectra, assuming a continuous surface layer model.

UR - http://www.scopus.com/inward/record.url?scp=0000872370&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0000872370&partnerID=8YFLogxK

U2 - 10.1111/j.1151-2916.1995.tb08613.x

DO - 10.1111/j.1151-2916.1995.tb08613.x

M3 - Article

AN - SCOPUS:0000872370

VL - 78

SP - 2021

EP - 2026

JO - Journal of the American Ceramic Society

JF - Journal of the American Ceramic Society

SN - 0002-7820

IS - 8

ER -