Characterization of structural dynamics of VO₂ thin film on c-Al₂O₃ using in-air time-resolved x-ray diffraction

Engineering & Materials Science

• Vanadium dioxide 100%
• Structural dynamics 70%
• Diffraction 68%
• Aluminum oxide 61%
• Thin films 60%
• X rays 57%
• Atoms 39%
• Air 35%
• Phase transitions 26%
• Femtosecond lasers 19%
• Vanadium 15%
• Temperature 10%

Physics & Astronomy

• dynamic structural analysis 80%
• x ray diffraction 55%
• air 38%
• characterization 35%
• cells 34%
• thin films 32%
• vanadium 21%
• atoms 16%
• Bragg angle 14%
• dioxides 11%
• repetition 9%
• diffraction 5%

Chemical Compounds

• Tetragonal Space Group 56%
• Vanadium Atom 44%
• Displacement 26%
• Monoclinic Space Group 23%