Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8

F. Z. Guo, T. Muro, T. Matsushita, Takanori Wakita, H. Ohashi, Y. Senba, T. Kinoshita, K. Kobayashi, Y. Saitoh, T. Koshikawa, T. Yasue, M. Oura, T. Takeuchi, S. Shin

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

Spectroscopic photoemission and low energy electron microscope (SPELEEM) improved its performance after installation at BL17SU/SPring-8, where a multipolarization-mode undulator is employed to produce circularly and linearly polarized soft x rays. This undulator enables us to study the domain structures of ferromagnetic and antiferromagnetic materials by x-ray magnetic circular dichroism and x-ray magnetic linear dichroism. SPELEEM is used to study light elements (C, N, and O), 3d transition-metal elements and 4f rare earth elements, utilizing a wide range of photon energies. The two cylindrical mirrors adopted in front of SPELEEM ensure an illumination area of 14×14 μ m2 on the samples. The lateral resolution of a secondary electron photoemission electron microscope image is estimated to be better than 85 nm, whereas the energy resolution of the instrument is better than 0.4 eV.

Original languageEnglish
Article number066107
JournalReview of Scientific Instruments
Volume78
Issue number6
DOIs
Publication statusPublished - 2007
Externally publishedYes

Fingerprint

Photoemission
Electron microscopes
photoelectric emission
electron microscopes
X rays
Wigglers
Dichroism
Chemical elements
Antiferromagnetic materials
x rays
dichroism
Ferromagnetic materials
energy
Rare earth elements
ferromagnetic materials
light elements
Transition metals
Photons
Lighting
installing

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

Cite this

Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8. / Guo, F. Z.; Muro, T.; Matsushita, T.; Wakita, Takanori; Ohashi, H.; Senba, Y.; Kinoshita, T.; Kobayashi, K.; Saitoh, Y.; Koshikawa, T.; Yasue, T.; Oura, M.; Takeuchi, T.; Shin, S.

In: Review of Scientific Instruments, Vol. 78, No. 6, 066107, 2007.

Research output: Contribution to journalArticle

Guo, FZ, Muro, T, Matsushita, T, Wakita, T, Ohashi, H, Senba, Y, Kinoshita, T, Kobayashi, K, Saitoh, Y, Koshikawa, T, Yasue, T, Oura, M, Takeuchi, T & Shin, S 2007, 'Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8', Review of Scientific Instruments, vol. 78, no. 6, 066107. https://doi.org/10.1063/1.2748387
Guo, F. Z. ; Muro, T. ; Matsushita, T. ; Wakita, Takanori ; Ohashi, H. ; Senba, Y. ; Kinoshita, T. ; Kobayashi, K. ; Saitoh, Y. ; Koshikawa, T. ; Yasue, T. ; Oura, M. ; Takeuchi, T. ; Shin, S. / Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8. In: Review of Scientific Instruments. 2007 ; Vol. 78, No. 6.
@article{8c90d9a0de0a420dab0ff3323336b13d,
title = "Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8",
abstract = "Spectroscopic photoemission and low energy electron microscope (SPELEEM) improved its performance after installation at BL17SU/SPring-8, where a multipolarization-mode undulator is employed to produce circularly and linearly polarized soft x rays. This undulator enables us to study the domain structures of ferromagnetic and antiferromagnetic materials by x-ray magnetic circular dichroism and x-ray magnetic linear dichroism. SPELEEM is used to study light elements (C, N, and O), 3d transition-metal elements and 4f rare earth elements, utilizing a wide range of photon energies. The two cylindrical mirrors adopted in front of SPELEEM ensure an illumination area of 14×14 μ m2 on the samples. The lateral resolution of a secondary electron photoemission electron microscope image is estimated to be better than 85 nm, whereas the energy resolution of the instrument is better than 0.4 eV.",
author = "Guo, {F. Z.} and T. Muro and T. Matsushita and Takanori Wakita and H. Ohashi and Y. Senba and T. Kinoshita and K. Kobayashi and Y. Saitoh and T. Koshikawa and T. Yasue and M. Oura and T. Takeuchi and S. Shin",
year = "2007",
doi = "10.1063/1.2748387",
language = "English",
volume = "78",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "6",

}

TY - JOUR

T1 - Characterization of spectroscopic photoemission and low energy electron microscope using multipolarized soft x rays at BL17SU/SPring-8

AU - Guo, F. Z.

AU - Muro, T.

AU - Matsushita, T.

AU - Wakita, Takanori

AU - Ohashi, H.

AU - Senba, Y.

AU - Kinoshita, T.

AU - Kobayashi, K.

AU - Saitoh, Y.

AU - Koshikawa, T.

AU - Yasue, T.

AU - Oura, M.

AU - Takeuchi, T.

AU - Shin, S.

PY - 2007

Y1 - 2007

N2 - Spectroscopic photoemission and low energy electron microscope (SPELEEM) improved its performance after installation at BL17SU/SPring-8, where a multipolarization-mode undulator is employed to produce circularly and linearly polarized soft x rays. This undulator enables us to study the domain structures of ferromagnetic and antiferromagnetic materials by x-ray magnetic circular dichroism and x-ray magnetic linear dichroism. SPELEEM is used to study light elements (C, N, and O), 3d transition-metal elements and 4f rare earth elements, utilizing a wide range of photon energies. The two cylindrical mirrors adopted in front of SPELEEM ensure an illumination area of 14×14 μ m2 on the samples. The lateral resolution of a secondary electron photoemission electron microscope image is estimated to be better than 85 nm, whereas the energy resolution of the instrument is better than 0.4 eV.

AB - Spectroscopic photoemission and low energy electron microscope (SPELEEM) improved its performance after installation at BL17SU/SPring-8, where a multipolarization-mode undulator is employed to produce circularly and linearly polarized soft x rays. This undulator enables us to study the domain structures of ferromagnetic and antiferromagnetic materials by x-ray magnetic circular dichroism and x-ray magnetic linear dichroism. SPELEEM is used to study light elements (C, N, and O), 3d transition-metal elements and 4f rare earth elements, utilizing a wide range of photon energies. The two cylindrical mirrors adopted in front of SPELEEM ensure an illumination area of 14×14 μ m2 on the samples. The lateral resolution of a secondary electron photoemission electron microscope image is estimated to be better than 85 nm, whereas the energy resolution of the instrument is better than 0.4 eV.

UR - http://www.scopus.com/inward/record.url?scp=34547251071&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34547251071&partnerID=8YFLogxK

U2 - 10.1063/1.2748387

DO - 10.1063/1.2748387

M3 - Article

VL - 78

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 6

M1 - 066107

ER -