Change of lattice constant due to hybridization effect of a ferromagnetic semiconductor EuO

H. Miyazaki, T. Ito, H. J. Im, Kensei Terashima, T. Iizuka, S. Yagi, M. Kato, K. Soda, S. Kimura

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We have measured the temperature-dependent X-ray diffraction pattern of a single-crystalline EuO (100) thin film to investigate the change of the lattice constant due to the ferromagnetic phase transition. No structural transition was observed and the contracting rate of the lattice constant was dramatically increases below the ferromagnetic phase transition temperature. It indicates that the hybridization intensity between the Eu 4f state and the other O 2p and Eu 5d states increases in the ferromagnetic phase.

Original languageEnglish
Article number012124
JournalJournal of Physics: Conference Series
Volume200
Issue numberSECTION 1
DOIs
Publication statusPublished - 2010
Externally publishedYes

    Fingerprint

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Miyazaki, H., Ito, T., Im, H. J., Terashima, K., Iizuka, T., Yagi, S., Kato, M., Soda, K., & Kimura, S. (2010). Change of lattice constant due to hybridization effect of a ferromagnetic semiconductor EuO. Journal of Physics: Conference Series, 200(SECTION 1), [012124]. https://doi.org/10.1088/1742-6596/200/1/012124