Carrier distribution and superconductivity in multilayer high-Tc cuprates proved by 63Cu NMR

Y. Tokunaga; H. Kotegawa; K. Ishida; G. Q. Zheng; Y. Kitaoka; K. Tokiwa; A. Iyo; H. Ihara

doi:10.1023/a:1022506725017

Carrier distribution and superconductivity in multilayer high-T_c cuprates proved by ⁶³Cu NMR

Y. Tokunaga, H. Kotegawa, K. Ishida, G. Q. Zheng, Y. Kitaoka, K. Tokiwa, A. Iyo, H. Ihara

Research output: Contribution to journal › Article › peer-review

43 Citations (Scopus)

Abstract

The carrier distribution among the inequivalent CuO₂ planes in multilayer cuprates is investigated by ⁶³Cu Knight shift measurement with varying the carrier concentration, δ and the number of CuO₂ plane in a unit cell, n. We found that 70 (60)% of total carriers are doped selectively into two outer CuO₂ planes in n = 3 (4). This indicates resultantly that the inhomogeneity of carrier distribution increases with increasing δ and n in multilayer cuprates.

Original language	English
Pages (from-to)	473-477
Number of pages	5
Journal	Journal of Low Temperature Physics
Volume	117
Issue number	3-4
DOIs	https://doi.org/10.1023/a:1022506725017
Publication status	Published - 1999
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Materials Science(all)
Condensed Matter Physics

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abstract = "The carrier distribution among the inequivalent CuO2 planes in multilayer cuprates is investigated by 63Cu Knight shift measurement with varying the carrier concentration, δ and the number of CuO2 plane in a unit cell, n. We found that 70 (60)% of total carriers are doped selectively into two outer CuO2 planes in n = 3 (4). This indicates resultantly that the inhomogeneity of carrier distribution increases with increasing δ and n in multilayer cuprates.",

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AU - Tokunaga, Y.

AU - Kotegawa, H.

AU - Ishida, K.

AU - Zheng, G. Q.

AU - Kitaoka, Y.

AU - Tokiwa, K.

AU - Iyo, A.

AU - Ihara, H.

PY - 1999

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AB - The carrier distribution among the inequivalent CuO2 planes in multilayer cuprates is investigated by 63Cu Knight shift measurement with varying the carrier concentration, δ and the number of CuO2 plane in a unit cell, n. We found that 70 (60)% of total carriers are doped selectively into two outer CuO2 planes in n = 3 (4). This indicates resultantly that the inhomogeneity of carrier distribution increases with increasing δ and n in multilayer cuprates.

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