Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2

Kensei Terashima, J. Sonoyama, M. Sunagawa, H. Fujiwara, T. Nagayama, T. Muro, M. Nagao, S. Watauchi, I. Tanaka, H. Okazaki, Y. Takano, Y. Mizuguchi, H. Usui, K. Suzuki, K. Kuroki, Takanori Wakita, Yuji Muraoka, Takayoshi Yokoya

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Bulk electronic structure of novel layered superconductor Nd(O,F)BiS2 was studied by using soft x-ray angle-resolved photoelectron spectroscopy (ARPES). Electron-like Fermi surface centered at the X(R) point was observed, consistent with earlier ARPES reports on surface-sensitive VUV light source. Based on the comparison of the electronic structure between Nd(O,F)BiS2 and La(O,F)BiS2, we discuss possible important factors for the superconductivity in this series of material.

Original languageEnglish
Article number012003
JournalJournal of Physics: Conference Series
Issue number1
Publication statusPublished - Feb 5 2016


ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Terashima, K., Sonoyama, J., Sunagawa, M., Fujiwara, H., Nagayama, T., Muro, T., Nagao, M., Watauchi, S., Tanaka, I., Okazaki, H., Takano, Y., Mizuguchi, Y., Usui, H., Suzuki, K., Kuroki, K., Wakita, T., Muraoka, Y., & Yokoya, T. (2016). Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2 Journal of Physics: Conference Series, 683(1), [012003]. https://doi.org/10.1088/1742-6596/683/1/012003