Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2

K. Terashima, J. Sonoyama, M. Sunagawa, H. Fujiwara, T. Nagayama, T. Muro, M. Nagao, S. Watauchi, I. Tanaka, H. Okazaki, Y. Takano, Y. Mizuguchi, H. Usui, K. Suzuki, K. Kuroki, T. Wakita, Y. Muraoka, T. Yokoya

Research output: Contribution to journalConference article

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Abstract

Bulk electronic structure of novel layered superconductor Nd(O,F)BiS2 was studied by using soft x-ray angle-resolved photoelectron spectroscopy (ARPES). Electron-like Fermi surface centered at the X(R) point was observed, consistent with earlier ARPES reports on surface-sensitive VUV light source. Based on the comparison of the electronic structure between Nd(O,F)BiS2 and La(O,F)BiS2, we discuss possible important factors for the superconductivity in this series of material.

Original languageEnglish
Article number012003
JournalJournal of Physics: Conference Series
Volume683
Issue number1
DOIs
Publication statusPublished - Feb 5 2016
EventTMU International Symposium on New Quantum Phases Emerging from Novel Crystal Structure - Tokyo, Japan
Duration: Sep 24 2015Sep 25 2015

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Terashima, K., Sonoyama, J., Sunagawa, M., Fujiwara, H., Nagayama, T., Muro, T., Nagao, M., Watauchi, S., Tanaka, I., Okazaki, H., Takano, Y., Mizuguchi, Y., Usui, H., Suzuki, K., Kuroki, K., Wakita, T., Muraoka, Y., & Yokoya, T. (2016). Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2. Journal of Physics: Conference Series, 683(1), [012003]. https://doi.org/10.1088/1742-6596/683/1/012003