Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2

Kensei Terashima; J. Sonoyama; M. Sunagawa; H. Fujiwara; T. Nagayama; T. Muro; M. Nagao; S. Watauchi; I. Tanaka; H. Okazaki; Y. Takano; Y. Mizuguchi; H. Usui; K. Suzuki; K. Kuroki; Takanori Wakita; Yuji Muraoka; Takayoshi Yokoya

doi:10.1088/1742-6596/683/1/012003

Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS₂

Kensei Terashima, J. Sonoyama, M. Sunagawa, H. Fujiwara, T. Nagayama, T. Muro, M. Nagao, S. Watauchi, I. Tanaka, H. Okazaki, Y. Takano, Y. Mizuguchi, H. Usui, K. Suzuki, K. Kuroki, Takanori Wakita, Yuji Muraoka, Takayoshi Yokoya

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Abstract

Bulk electronic structure of novel layered superconductor Nd(O,F)BiS₂ was studied by using soft x-ray angle-resolved photoelectron spectroscopy (ARPES). Electron-like Fermi surface centered at the X(R) point was observed, consistent with earlier ARPES reports on surface-sensitive VUV light source. Based on the comparison of the electronic structure between Nd(O,F)BiS₂ and La(O,F)BiS₂, we discuss possible important factors for the superconductivity in this series of material.

Original language	English
Article number	012003
Journal	Journal of Physics: Conference Series
Volume	683
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/683/1/012003
Publication status	Published - Feb 5 2016

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ASJC Scopus subject areas

Physics and Astronomy(all)

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Terashima, K., Sonoyama, J., Sunagawa, M., Fujiwara, H., Nagayama, T., Muro, T., Nagao, M., Watauchi, S., Tanaka, I., Okazaki, H., Takano, Y., Mizuguchi, Y., Usui, H., Suzuki, K., Kuroki, K., Wakita, T., Muraoka, Y., & Yokoya, T. (2016). Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS₂ Journal of Physics: Conference Series, 683(1), [012003]. https://doi.org/10.1088/1742-6596/683/1/012003

Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS₂ . / Terashima, Kensei; Sonoyama, J.; Sunagawa, M.; Fujiwara, H.; Nagayama, T.; Muro, T.; Nagao, M.; Watauchi, S.; Tanaka, I.; Okazaki, H.; Takano, Y.; Mizuguchi, Y.; Usui, H.; Suzuki, K.; Kuroki, K.; Wakita, Takanori ; Muraoka, Yuji ; Yokoya, Takayoshi.

In: Journal of Physics: Conference Series, Vol. 683, No. 1, 012003, 05.02.2016.

Research output: Contribution to journal › Article

Terashima, K, Sonoyama, J, Sunagawa, M, Fujiwara, H, Nagayama, T, Muro, T, Nagao, M, Watauchi, S, Tanaka, I, Okazaki, H, Takano, Y, Mizuguchi, Y, Usui, H, Suzuki, K, Kuroki, K, Wakita, T , Muraoka, Y & Yokoya, T 2016, 'Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS₂ ', Journal of Physics: Conference Series, vol. 683, no. 1, 012003. https://doi.org/10.1088/1742-6596/683/1/012003

Terashima, Kensei ; Sonoyama, J. ; Sunagawa, M. ; Fujiwara, H. ; Nagayama, T. ; Muro, T. ; Nagao, M. ; Watauchi, S. ; Tanaka, I. ; Okazaki, H. ; Takano, Y. ; Mizuguchi, Y. ; Usui, H. ; Suzuki, K. ; Kuroki, K. ; Wakita, Takanori ; Muraoka, Yuji ; Yokoya, Takayoshi. / Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS₂ In: Journal of Physics: Conference Series. 2016 ; Vol. 683, No. 1.

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10.1088/1742-6596/683/1/012003