Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2

Kensei Terashima, J. Sonoyama, M. Sunagawa, H. Fujiwara, T. Nagayama, T. Muro, M. Nagao, S. Watauchi, I. Tanaka, H. Okazaki, Y. Takano, Y. Mizuguchi, H. Usui, K. Suzuki, K. Kuroki, T. Wakita, Y. Muraoka, T. Yokoya

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)


Bulk electronic structure of novel layered superconductor Nd(O,F)BiS2 was studied by using soft x-ray angle-resolved photoelectron spectroscopy (ARPES). Electron-like Fermi surface centered at the X(R) point was observed, consistent with earlier ARPES reports on surface-sensitive VUV light source. Based on the comparison of the electronic structure between Nd(O,F)BiS2 and La(O,F)BiS2, we discuss possible important factors for the superconductivity in this series of material.

Original languageEnglish
Article number012003
JournalJournal of Physics: Conference Series
Issue number1
Publication statusPublished - Feb 5 2016
EventTMU International Symposium on New Quantum Phases Emerging from Novel Crystal Structure - Tokyo, Japan
Duration: Sept 24 2015Sept 25 2015

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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