Bug report recommendation for code inspection

Shin Fujiwara, Hideaki Hata, Akito Monden, Kenichi Matsumoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Large software projects such as Mozilla Firefox and Eclipse own more than ten thousand bug reports that have been reported but left unresolved. To utilize such a great amount of unresolved bug reports and accelerate bug detection and removal, we propose to a way recommend programmers a bug report that is likely to contain failure descriptions related to a source file being inspected. We employ the vector space model (VSM) to make a relevancy ranking of bug reports to a given source file. The result of an experiment using data of three open source software projects showed that the accuracies of recommendations ranged from 21.74% to 60.05% in terms of the percentage of recommendations that contained relevant bug reports in a top 10 recommended list.

Original languageEnglish
Title of host publication2015 IEEE 1st International Workshop on Software Analytics, SWAN 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages9-12
Number of pages4
ISBN (Electronic)9781467369237
DOIs
Publication statusPublished - Mar 30 2015
Externally publishedYes
Event2015 1st IEEE International Workshop on Software Analytics, SWAN 2015 - Montreal, Canada
Duration: Mar 2 2015 → …

Publication series

Name2015 IEEE 1st International Workshop on Software Analytics, SWAN 2015 - Proceedings

Other

Other2015 1st IEEE International Workshop on Software Analytics, SWAN 2015
CountryCanada
CityMontreal
Period3/2/15 → …

ASJC Scopus subject areas

  • Software
  • Information Systems

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  • Cite this

    Fujiwara, S., Hata, H., Monden, A., & Matsumoto, K. (2015). Bug report recommendation for code inspection. In 2015 IEEE 1st International Workshop on Software Analytics, SWAN 2015 - Proceedings (pp. 9-12). [7070481] (2015 IEEE 1st International Workshop on Software Analytics, SWAN 2015 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SWAN.2015.7070481