Abstract
Objective: Enamel bond durability of three new alternative etchants combined with three representative adhesives was determined. Methods: The ‘immediate’ and ‘aged’ micro-tensile bond strength (μTBS) of the 3-step etch&rinse adhesive OptiBond FL (‘O-FL’, Kerr), 2-step self-etch (SE) adhesive Clearfil SE Bond 2 (‘C-SE2’, Kuraray Noritake) and universal adhesive Adhese Universal (‘ADU’, Ivoclar Vivadent) were measured when bonded to enamel following either a proprietary organic acid-containing Enamel Conditioner (‘EC’, Shofu), a phosphoric-acid monomer-containing Multi Etchant (‘ME’, Yamakin: 10-methacryloyloxy tetraethylene glycol dihydrogenphosphate or MTEGP), or a metal salt-based ZON etchant (‘ZON’, Ivoclar Vivadent: ZrO(NO3)2). All alternative etchants were used in replacement of phosphoric acid, the latter (K-Etchant, Kuraray Noritake) also used with O-FL and ADU, in addition to C-SE2 that was solely used in SE mode (controls). The enamel-etching patterns and de-bonded fracture surfaces were examined by SEM, while the interfaces with enamel were ultra-morphologically characterized by TEM. Results: No statistically significant difference in immediate and aged μTBS, obtained by combining the three alternative etchants with the three adhesives, was recorded as compared with the respective controls, except for ME combined with O-FL. Upon aging, significant reduction in μTBS was recorded for the ME/C-SE2 and ME/ADU combinations. The percentage of adhesive failures increased with aging. SEM revealed similar etching patterns produced by EC and ZON as by classic phosphoric-acid etching, for which also numerous micro-resin tags at the adhesive-enamel interface were disclosed. Significance: Durable bonding to enamel was generally obtained for all etchant/adhesive combinations with the exception of the ME/O-FL combination.
| Original language | English |
|---|---|
| Journal | Dental Materials |
| DOIs | |
| Publication status | Accepted/In press - Jan 1 2019 |
Fingerprint
Keywords
- Adhesive
- Enamel
- Lewis acids
- Phosphoric acid
- TEM
- Zirconium oxynitrate
ASJC Scopus subject areas
- Materials Science(all)
- Dentistry(all)
- Mechanics of Materials
Cite this
Bonding to enamel using alternative Enamel Conditioner/etchants. / Yao, Chenmin; Ahmed, Mohammed H.; Yoshihara, Kumiko; Mercelis, Ben; Parise Gré, Cristina; Van Landuyt, Kirsten L.; Huang, Cui; Van Meerbeek, Bart.
In: Dental Materials, 01.01.2019.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Bonding to enamel using alternative Enamel Conditioner/etchants
AU - Yao, Chenmin
AU - Ahmed, Mohammed H.
AU - Yoshihara, Kumiko
AU - Mercelis, Ben
AU - Parise Gré, Cristina
AU - Van Landuyt, Kirsten L.
AU - Huang, Cui
AU - Van Meerbeek, Bart
PY - 2019/1/1
Y1 - 2019/1/1
N2 - Objective: Enamel bond durability of three new alternative etchants combined with three representative adhesives was determined. Methods: The ‘immediate’ and ‘aged’ micro-tensile bond strength (μTBS) of the 3-step etch&rinse adhesive OptiBond FL (‘O-FL’, Kerr), 2-step self-etch (SE) adhesive Clearfil SE Bond 2 (‘C-SE2’, Kuraray Noritake) and universal adhesive Adhese Universal (‘ADU’, Ivoclar Vivadent) were measured when bonded to enamel following either a proprietary organic acid-containing Enamel Conditioner (‘EC’, Shofu), a phosphoric-acid monomer-containing Multi Etchant (‘ME’, Yamakin: 10-methacryloyloxy tetraethylene glycol dihydrogenphosphate or MTEGP), or a metal salt-based ZON etchant (‘ZON’, Ivoclar Vivadent: ZrO(NO3)2). All alternative etchants were used in replacement of phosphoric acid, the latter (K-Etchant, Kuraray Noritake) also used with O-FL and ADU, in addition to C-SE2 that was solely used in SE mode (controls). The enamel-etching patterns and de-bonded fracture surfaces were examined by SEM, while the interfaces with enamel were ultra-morphologically characterized by TEM. Results: No statistically significant difference in immediate and aged μTBS, obtained by combining the three alternative etchants with the three adhesives, was recorded as compared with the respective controls, except for ME combined with O-FL. Upon aging, significant reduction in μTBS was recorded for the ME/C-SE2 and ME/ADU combinations. The percentage of adhesive failures increased with aging. SEM revealed similar etching patterns produced by EC and ZON as by classic phosphoric-acid etching, for which also numerous micro-resin tags at the adhesive-enamel interface were disclosed. Significance: Durable bonding to enamel was generally obtained for all etchant/adhesive combinations with the exception of the ME/O-FL combination.
AB - Objective: Enamel bond durability of three new alternative etchants combined with three representative adhesives was determined. Methods: The ‘immediate’ and ‘aged’ micro-tensile bond strength (μTBS) of the 3-step etch&rinse adhesive OptiBond FL (‘O-FL’, Kerr), 2-step self-etch (SE) adhesive Clearfil SE Bond 2 (‘C-SE2’, Kuraray Noritake) and universal adhesive Adhese Universal (‘ADU’, Ivoclar Vivadent) were measured when bonded to enamel following either a proprietary organic acid-containing Enamel Conditioner (‘EC’, Shofu), a phosphoric-acid monomer-containing Multi Etchant (‘ME’, Yamakin: 10-methacryloyloxy tetraethylene glycol dihydrogenphosphate or MTEGP), or a metal salt-based ZON etchant (‘ZON’, Ivoclar Vivadent: ZrO(NO3)2). All alternative etchants were used in replacement of phosphoric acid, the latter (K-Etchant, Kuraray Noritake) also used with O-FL and ADU, in addition to C-SE2 that was solely used in SE mode (controls). The enamel-etching patterns and de-bonded fracture surfaces were examined by SEM, while the interfaces with enamel were ultra-morphologically characterized by TEM. Results: No statistically significant difference in immediate and aged μTBS, obtained by combining the three alternative etchants with the three adhesives, was recorded as compared with the respective controls, except for ME combined with O-FL. Upon aging, significant reduction in μTBS was recorded for the ME/C-SE2 and ME/ADU combinations. The percentage of adhesive failures increased with aging. SEM revealed similar etching patterns produced by EC and ZON as by classic phosphoric-acid etching, for which also numerous micro-resin tags at the adhesive-enamel interface were disclosed. Significance: Durable bonding to enamel was generally obtained for all etchant/adhesive combinations with the exception of the ME/O-FL combination.
KW - Adhesive
KW - Enamel
KW - Lewis acids
KW - Phosphoric acid
KW - TEM
KW - Zirconium oxynitrate
UR - http://www.scopus.com/inward/record.url?scp=85070525387&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85070525387&partnerID=8YFLogxK
U2 - 10.1016/j.dental.2019.07.022
DO - 10.1016/j.dental.2019.07.022
M3 - Article
AN - SCOPUS:85070525387
JO - Dental Materials
JF - Dental Materials
SN - 0109-5641
ER -