Atomic structure and field evaporation of carbon nanotube studied by atom probe field ion microscopy

N. Ohmae; N. Matsumoto; T. Ohata; H. Kinoshita

doi:10.1016/j.diamond.2007.01.032

Atomic structure and field evaporation of carbon nanotube studied by atom probe field ion microscopy

N. Ohmae, N. Matsumoto, T. Ohata, H. Kinoshita

Graduate School of Natural Science and Technology

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Using atom probe field ion microscopy (APFIM), the structure of the apex of single-walled carbon nanotube (SWCNT) and multi-walled carbon nanotube (MWCNT) has been studied. By analyzing the FIM image, it became possible to identify the chirality and conductivity of SWCNT. However, a clear FIM image was not successfully obtained for MWCNT due possibly to the difference in heights of each graphene wall. AP of FIM images showed that ions of carbon clusters, such as C₁₄+, C₁₅+, C₁₈+ and C₂₀+, were field evaporated from SWCNT and MWCNT. Since all of these carbon clusters may include a pentagonal plane, it is considered that, under high electric field, a hexagonal plane of graphene reconstructed into pentagonal plane and consequently these clusters field evaporated by the local concentration of electric field at the protruded pentagonal plane.

Original language	English
Pages (from-to)	1179-1182
Number of pages	4
Journal	Diamond and Related Materials
Volume	16
Issue number	4-7 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.diamond.2007.01.032
Publication status	Published - Apr 2007

Keywords

Atom probe field ion microscope
Carbon nanotube
Field evaporation
Pentagonal plane

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Chemistry(all)
Mechanical Engineering
Materials Chemistry
Electrical and Electronic Engineering

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title = "Atomic structure and field evaporation of carbon nanotube studied by atom probe field ion microscopy",

abstract = "Using atom probe field ion microscopy (APFIM), the structure of the apex of single-walled carbon nanotube (SWCNT) and multi-walled carbon nanotube (MWCNT) has been studied. By analyzing the FIM image, it became possible to identify the chirality and conductivity of SWCNT. However, a clear FIM image was not successfully obtained for MWCNT due possibly to the difference in heights of each graphene wall. AP of FIM images showed that ions of carbon clusters, such as C14+, C15+, C18+ and C20+, were field evaporated from SWCNT and MWCNT. Since all of these carbon clusters may include a pentagonal plane, it is considered that, under high electric field, a hexagonal plane of graphene reconstructed into pentagonal plane and consequently these clusters field evaporated by the local concentration of electric field at the protruded pentagonal plane.",

keywords = "Atom probe field ion microscope, Carbon nanotube, Field evaporation, Pentagonal plane",

author = "N. Ohmae and N. Matsumoto and T. Ohata and H. Kinoshita",

note = "Funding Information: A part of this work was supported by a Grant-in-Aid for Scientific Research (A) from the Ministry of Education, Culture, Sport, Science and Technology. ",

year = "2007",

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doi = "10.1016/j.diamond.2007.01.032",

language = "English",

volume = "16",

pages = "1179--1182",

journal = "Diamond and Related Materials",

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T1 - Atomic structure and field evaporation of carbon nanotube studied by atom probe field ion microscopy

AU - Ohmae, N.

AU - Matsumoto, N.

AU - Ohata, T.

AU - Kinoshita, H.

N1 - Funding Information: A part of this work was supported by a Grant-in-Aid for Scientific Research (A) from the Ministry of Education, Culture, Sport, Science and Technology.

PY - 2007/4

Y1 - 2007/4

N2 - Using atom probe field ion microscopy (APFIM), the structure of the apex of single-walled carbon nanotube (SWCNT) and multi-walled carbon nanotube (MWCNT) has been studied. By analyzing the FIM image, it became possible to identify the chirality and conductivity of SWCNT. However, a clear FIM image was not successfully obtained for MWCNT due possibly to the difference in heights of each graphene wall. AP of FIM images showed that ions of carbon clusters, such as C14+, C15+, C18+ and C20+, were field evaporated from SWCNT and MWCNT. Since all of these carbon clusters may include a pentagonal plane, it is considered that, under high electric field, a hexagonal plane of graphene reconstructed into pentagonal plane and consequently these clusters field evaporated by the local concentration of electric field at the protruded pentagonal plane.

AB - Using atom probe field ion microscopy (APFIM), the structure of the apex of single-walled carbon nanotube (SWCNT) and multi-walled carbon nanotube (MWCNT) has been studied. By analyzing the FIM image, it became possible to identify the chirality and conductivity of SWCNT. However, a clear FIM image was not successfully obtained for MWCNT due possibly to the difference in heights of each graphene wall. AP of FIM images showed that ions of carbon clusters, such as C14+, C15+, C18+ and C20+, were field evaporated from SWCNT and MWCNT. Since all of these carbon clusters may include a pentagonal plane, it is considered that, under high electric field, a hexagonal plane of graphene reconstructed into pentagonal plane and consequently these clusters field evaporated by the local concentration of electric field at the protruded pentagonal plane.

KW - Atom probe field ion microscope

KW - Carbon nanotube

KW - Field evaporation

KW - Pentagonal plane

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DO - 10.1016/j.diamond.2007.01.032

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JO - Diamond and Related Materials

JF - Diamond and Related Materials

SN - 0925-9635

IS - 4-7 SPEC. ISS.

ER -

Atomic structure and field evaporation of carbon nanotube studied by atom probe field ion microscopy

Abstract

Keywords

ASJC Scopus subject areas

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