Abstract
Si(111) 7 × 7 surfaces were observed at an atomic scale by noncontact atomic force microscopy (ncAFM) and scanning Kelvin probe microscopy (SKPM). A vacancy at the Si surface was resolved by both ncAFM and SKPM. This indicates that SKPM, as well as ncAFM, has a true atomic-scale lateral resolution. In the atom-resolved SKPM observations, two types of image contrast were acquired even when the observation conditions were the same except for the surface condition of a cantilever tip. The result experimentally revealed that the contrast of an atom-resolved SKPM image strongly depended on the surface condition of the probe tip.
| Original language | English |
|---|---|
| Pages (from-to) | L1178-L1180 |
| Journal | Japanese Journal of Applied Physics, Part 2: Letters |
| Volume | 41 |
| Issue number | 10 B |
| Publication status | Published - Oct 15 2002 |
| Externally published | Yes |
Keywords
- AFM
- Atom-resolved image
- Contrast inversion
- Noncontact
- SKPM
- Si(111)
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy (miscellaneous)
- Physics and Astronomy(all)