Application of Thin Film Diffractometer to Structural Study of Amorphous Thin Films

Tokuro Nanba

Research output: Contribution to journal › Article

4 Citations (Scopus)
Original languageEnglish
JournalAnalytical Science
Volume5
Publication statusPublished - 1989

Cite this

Application of Thin Film Diffractometer to Structural Study of Amorphous Thin Films. / Nanba, Tokuro.

In: Analytical Science, Vol. 5, 1989.

Research output: Contribution to journal › Article

Nanba, T 1989, 'Application of Thin Film Diffractometer to Structural Study of Amorphous Thin Films', Analytical Science, vol. 5.
Nanba T. Application of Thin Film Diffractometer to Structural Study of Amorphous Thin Films. Analytical Science. 1989;5.
Nanba, Tokuro. / Application of Thin Film Diffractometer to Structural Study of Amorphous Thin Films. In: Analytical Science. 1989 ; Vol. 5.
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journal = "Analytical Science",

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