Application of Thin Film Diffractometer to Structural Study of Amorphous Thin Films

Research output: Contribution to journalArticle

4 Citations (Scopus)
Original languageEnglish
JournalAnalytical Science
Volume5
Publication statusPublished - 1989

Cite this

@article{90e8660be51d48f6807801ef3898e87d,
title = "Application of Thin Film Diffractometer to Structural Study of Amorphous Thin Films",
author = "Tokuro Nanba",
year = "1989",
language = "English",
volume = "5",
journal = "Analytical Science",

}

TY - JOUR

T1 - Application of Thin Film Diffractometer to Structural Study of Amorphous Thin Films

AU - Nanba, Tokuro

PY - 1989

Y1 - 1989

M3 - Article

VL - 5

JO - Analytical Science

JF - Analytical Science

ER -