Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials

Masato Kotsugi; Takanori Wakita; Naomi Kawamura; Toshiyuki Taniuchi; Kanta Ono; Motohiro Suzuki; Masaharu Oshima; Naoki Ishimatsu; Masaki Taniguchi; Hiroshi Maruyama

doi:10.1016/j.susc.2007.05.048

Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials

Masato Kotsugi, Takanori Wakita, Naomi Kawamura, Toshiyuki Taniuchi, Kanta Ono, Motohiro Suzuki, Masaharu Oshima, Naoki Ishimatsu, Masaki Taniguchi, Hiroshi Maruyama

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr₂FeO₄ (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.

Original language	English
Pages (from-to)	4764-4767
Number of pages	4
Journal	Surface Science
Volume	601
Issue number	20 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.susc.2007.05.048
Publication status	Published - Oct 15 2007
Externally published	Yes

Keywords

Chromite (CrFeO)
EXAFS
Iron meteorite
Photoelectron emission microscope (PEEM)
XAFS

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials. / Kotsugi, Masato; Wakita, Takanori; Kawamura, Naomi; Taniuchi, Toshiyuki; Ono, Kanta; Suzuki, Motohiro; Oshima, Masaharu; Ishimatsu, Naoki; Taniguchi, Masaki; Maruyama, Hiroshi.

In: Surface Science, Vol. 601, No. 20 SPEC. ISS., 15.10.2007, p. 4764-4767.

Research output: Contribution to journal › Article › peer-review

@article{34f6f67980524f95b3b83ddfc1c0042c,

title = "Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials",

abstract = "We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.",

keywords = "Chromite (CrFeO), EXAFS, Iron meteorite, Photoelectron emission microscope (PEEM), XAFS",

author = "Masato Kotsugi and Takanori Wakita and Naomi Kawamura and Toshiyuki Taniuchi and Kanta Ono and Motohiro Suzuki and Masaharu Oshima and Naoki Ishimatsu and Masaki Taniguchi and Hiroshi Maruyama",

year = "2007",

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doi = "10.1016/j.susc.2007.05.048",

language = "English",

volume = "601",

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journal = "Surface Science",

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T1 - Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials

AU - Kotsugi, Masato

AU - Wakita, Takanori

AU - Kawamura, Naomi

AU - Taniuchi, Toshiyuki

AU - Ono, Kanta

AU - Suzuki, Motohiro

AU - Oshima, Masaharu

AU - Ishimatsu, Naoki

AU - Taniguchi, Masaki

AU - Maruyama, Hiroshi

PY - 2007/10/15

Y1 - 2007/10/15

N2 - We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.

AB - We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.

KW - Chromite (CrFeO)

KW - EXAFS

KW - Iron meteorite

KW - Photoelectron emission microscope (PEEM)

KW - XAFS

UR - http://www.scopus.com/inward/record.url?scp=35148847386&partnerID=8YFLogxK

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U2 - 10.1016/j.susc.2007.05.048

DO - 10.1016/j.susc.2007.05.048

M3 - Article

AN - SCOPUS:35148847386

VL - 601

SP - 4764

EP - 4767

JO - Surface Science

JF - Surface Science

SN - 0039-6028

IS - 20 SPEC. ISS.

ER -

Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials

Abstract

Keywords

ASJC Scopus subject areas

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