Abstract
We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.
Original language | English |
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Pages (from-to) | 4764-4767 |
Number of pages | 4 |
Journal | Surface Science |
Volume | 601 |
Issue number | 20 SPEC. ISS. |
DOIs | |
Publication status | Published - Oct 15 2007 |
Externally published | Yes |
Keywords
- Chromite (CrFeO)
- EXAFS
- Iron meteorite
- Photoelectron emission microscope (PEEM)
- XAFS
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry