Abstract
We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.
| Original language | English |
|---|---|
| Pages (from-to) | 4764-4767 |
| Number of pages | 4 |
| Journal | Surface Science |
| Volume | 601 |
| Issue number | 20 SPEC. ISS. |
| DOIs | |
| Publication status | Published - Oct 15 2007 |
| Externally published | Yes |
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Keywords
- Chromite (CrFeO)
- EXAFS
- Iron meteorite
- Photoelectron emission microscope (PEEM)
- XAFS
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Condensed Matter Physics
- Surfaces and Interfaces
Cite this
Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials. / Kotsugi, Masato; Wakita, Takanori; Kawamura, Naomi; Taniuchi, Toshiyuki; Ono, Kanta; Suzuki, Motohiro; Oshima, Masaharu; Ishimatsu, Naoki; Taniguchi, Masaki; Maruyama, Hiroshi.
In: Surface Science, Vol. 601, No. 20 SPEC. ISS., 15.10.2007, p. 4764-4767.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials
AU - Kotsugi, Masato
AU - Wakita, Takanori
AU - Kawamura, Naomi
AU - Taniuchi, Toshiyuki
AU - Ono, Kanta
AU - Suzuki, Motohiro
AU - Oshima, Masaharu
AU - Ishimatsu, Naoki
AU - Taniguchi, Masaki
AU - Maruyama, Hiroshi
PY - 2007/10/15
Y1 - 2007/10/15
N2 - We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.
AB - We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.
KW - Chromite (CrFeO)
KW - EXAFS
KW - Iron meteorite
KW - Photoelectron emission microscope (PEEM)
KW - XAFS
UR - http://www.scopus.com/inward/record.url?scp=35148847386&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=35148847386&partnerID=8YFLogxK
U2 - 10.1016/j.susc.2007.05.048
DO - 10.1016/j.susc.2007.05.048
M3 - Article
AN - SCOPUS:35148847386
VL - 601
SP - 4764
EP - 4767
JO - Surface Science
JF - Surface Science
SN - 0039-6028
IS - 20 SPEC. ISS.
ER -