Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials

Masato Kotsugi; Takanori Wakita; Naomi Kawamura; Toshiyuki Taniuchi; Kanta Ono; Motohiro Suzuki; Masaharu Oshima; Naoki Ishimatsu; Masaki Taniguchi; Hiroshi Maruyama

doi:10.1016/j.susc.2007.05.048

Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials

Masato Kotsugi, Takanori Wakita, Naomi Kawamura, Toshiyuki Taniuchi, Kanta Ono, Motohiro Suzuki, Masaharu Oshima, Naoki Ishimatsu, Masaki Taniguchi, Hiroshi Maruyama

Research Institute for Interdisciplinary Science

Research output: Contribution to journal › Article

4 Citations (Scopus)

Abstract

We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr₂FeO₄ (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.

Original language	English
Pages (from-to)	4764-4767
Number of pages	4
Journal	Surface Science
Volume	601
Issue number	20 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.susc.2007.05.048
Publication status	Published - Oct 15 2007

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Keywords

Chromite (CrFeO)
EXAFS
Iron meteorite
Photoelectron emission microscope (PEEM)
XAFS

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

Cite this

Kotsugi, M., Wakita, T., Kawamura, N., Taniuchi, T., Ono, K., Suzuki, M., Oshima, M., Ishimatsu, N., Taniguchi, M., & Maruyama, H. (2007). Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials. Surface Science, 601(20 SPEC. ISS.), 4764-4767. https://doi.org/10.1016/j.susc.2007.05.048

Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials. / Kotsugi, Masato; Wakita, Takanori; Kawamura, Naomi; Taniuchi, Toshiyuki; Ono, Kanta; Suzuki, Motohiro; Oshima, Masaharu; Ishimatsu, Naoki; Taniguchi, Masaki; Maruyama, Hiroshi.

In: Surface Science, Vol. 601, No. 20 SPEC. ISS., 15.10.2007, p. 4764-4767.

Research output: Contribution to journal › Article

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abstract = "We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.",

keywords = "Chromite (CrFeO), EXAFS, Iron meteorite, Photoelectron emission microscope (PEEM), XAFS",

author = "Masato Kotsugi and Takanori Wakita and Naomi Kawamura and Toshiyuki Taniuchi and Kanta Ono and Motohiro Suzuki and Masaharu Oshima and Naoki Ishimatsu and Masaki Taniguchi and Hiroshi Maruyama",

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AU - Kotsugi, Masato

AU - Wakita, Takanori

AU - Kawamura, Naomi

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AU - Ono, Kanta

AU - Suzuki, Motohiro

AU - Oshima, Masaharu

AU - Ishimatsu, Naoki

AU - Taniguchi, Masaki

AU - Maruyama, Hiroshi

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AB - We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.

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KW - XAFS

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Access to Document

10.1016/j.susc.2007.05.048