Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials

Masato Kotsugi, Takanori Wakita, Naomi Kawamura, Toshiyuki Taniuchi, Kanta Ono, Motohiro Suzuki, Masaharu Oshima, Naoki Ishimatsu, Masaki Taniguchi, Hiroshi Maruyama

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4 Citations (Scopus)

Abstract

We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.

Original languageEnglish
Pages (from-to)4764-4767
Number of pages4
JournalSurface Science
Volume601
Issue number20 SPEC. ISS.
DOIs
Publication statusPublished - Oct 15 2007

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Keywords

  • Chromite (CrFeO)
  • EXAFS
  • Iron meteorite
  • Photoelectron emission microscope (PEEM)
  • XAFS

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Kotsugi, M., Wakita, T., Kawamura, N., Taniuchi, T., Ono, K., Suzuki, M., Oshima, M., Ishimatsu, N., Taniguchi, M., & Maruyama, H. (2007). Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials. Surface Science, 601(20 SPEC. ISS.), 4764-4767. https://doi.org/10.1016/j.susc.2007.05.048