Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials

Masato Kotsugi, Takanori Wakita, Naomi Kawamura, Toshiyuki Taniuchi, Kanta Ono, Motohiro Suzuki, Masaharu Oshima, Naoki Ishimatsu, Masaki Taniguchi, Hiroshi Maruyama

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.

Original languageEnglish
Pages (from-to)4764-4767
Number of pages4
JournalSurface Science
Volume601
Issue number20 SPEC. ISS.
DOIs
Publication statusPublished - Oct 15 2007
Externally publishedYes

Fingerprint

Chromite
chromites
Photoelectrons
Microscopic examination
photoelectrons
microscopy
inclusions
X ray absorption
Synchrotron radiation
radial distribution
Electronic structure
Distribution functions
synchrotron radiation
x rays
Photons
fine structure
distribution functions
electronic structure
X rays
photons

Keywords

  • Chromite (CrFeO)
  • EXAFS
  • Iron meteorite
  • Photoelectron emission microscope (PEEM)
  • XAFS

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Kotsugi, M., Wakita, T., Kawamura, N., Taniuchi, T., Ono, K., Suzuki, M., ... Maruyama, H. (2007). Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials. Surface Science, 601(20 SPEC. ISS.), 4764-4767. https://doi.org/10.1016/j.susc.2007.05.048

Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials. / Kotsugi, Masato; Wakita, Takanori; Kawamura, Naomi; Taniuchi, Toshiyuki; Ono, Kanta; Suzuki, Motohiro; Oshima, Masaharu; Ishimatsu, Naoki; Taniguchi, Masaki; Maruyama, Hiroshi.

In: Surface Science, Vol. 601, No. 20 SPEC. ISS., 15.10.2007, p. 4764-4767.

Research output: Contribution to journalArticle

Kotsugi, M, Wakita, T, Kawamura, N, Taniuchi, T, Ono, K, Suzuki, M, Oshima, M, Ishimatsu, N, Taniguchi, M & Maruyama, H 2007, 'Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials', Surface Science, vol. 601, no. 20 SPEC. ISS., pp. 4764-4767. https://doi.org/10.1016/j.susc.2007.05.048
Kotsugi M, Wakita T, Kawamura N, Taniuchi T, Ono K, Suzuki M et al. Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials. Surface Science. 2007 Oct 15;601(20 SPEC. ISS.):4764-4767. https://doi.org/10.1016/j.susc.2007.05.048
Kotsugi, Masato ; Wakita, Takanori ; Kawamura, Naomi ; Taniuchi, Toshiyuki ; Ono, Kanta ; Suzuki, Motohiro ; Oshima, Masaharu ; Ishimatsu, Naoki ; Taniguchi, Masaki ; Maruyama, Hiroshi. / Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials. In: Surface Science. 2007 ; Vol. 601, No. 20 SPEC. ISS. pp. 4764-4767.
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