Anomalous X-Ray Diffraction Line Shift in Heterogeneous Langmuir-Blodgett Multilayer Films

Yoshio Nogami, Hiroshi Hamanaka, Takehiko Ishiguro

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The X-ray diffraction pattern of Langmuir-Blodgett films formed with alternately deposited Cd stearate and Cd behenate exhibits anomalous shifts in the diffraction angles when they have the deposition order with dimerized Cd layers. The magnitude of the reciprocal vector of the n-th order is represented by Gn=nGa-(-1)ngn, where Ga is for averaged unit vector and gn is the shift that changes gradually with the index of diffraction and the multiplicity of the layers.

Original languageEnglish
Pages (from-to)1860-1863
Number of pages4
JournalJournal of the Physical Society of Japan
Volume60
Issue number6
DOIs
Publication statusPublished - 1991
Externally publishedYes

Keywords

  • Langmuir-Blodgett multilayer
  • superlattice
  • X-ray diffraction

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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