Analysis on the applicability of direct current electrical potential method to the detection of damage by multiple small internal cracks

N. Tada; Y. Hayashi; T. Kitamura; R. Ohtani

doi:10.1023/A:1007452331773

Analysis on the applicability of direct current electrical potential method to the detection of damage by multiple small internal cracks

N. Tada, Y. Hayashi, T. Kitamura, R. Ohtani

Research output: Contribution to journal › Article › peer-review

29 Citations (Scopus)

Abstract

The direct current electric potential around a number of penny-shaped cracks was analyzed by Crack-Flow Modification Method (CFMM) in order to investigate the applicability of the Direct Current Electrical Potential Method (DC-EPM) to the detection of damage due to multiple small internal cracks. The potential difference was calculated for the cracking process in a smooth round bar specimen of a Type 304 stainless steel under a creep-fatigue condition. It was clarified by the analysis that, in the case of the present creep-fatigue test, damage could be detected at about a half of the lifetime assuming that a change of 1 percent in the potential difference was measurable by a voltmeter.

Original language	English
Pages (from-to)	1-9
Number of pages	9
Journal	International Journal of Fracture
Volume	85
Issue number	1
DOIs	https://doi.org/10.1023/A:1007452331773
Publication status	Published - Jan 1 1997
Externally published	Yes

ASJC Scopus subject areas

Computational Mechanics
Modelling and Simulation
Mechanics of Materials

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abstract = "The direct current electric potential around a number of penny-shaped cracks was analyzed by Crack-Flow Modification Method (CFMM) in order to investigate the applicability of the Direct Current Electrical Potential Method (DC-EPM) to the detection of damage due to multiple small internal cracks. The potential difference was calculated for the cracking process in a smooth round bar specimen of a Type 304 stainless steel under a creep-fatigue condition. It was clarified by the analysis that, in the case of the present creep-fatigue test, damage could be detected at about a half of the lifetime assuming that a change of 1 percent in the potential difference was measurable by a voltmeter.",

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AU - Ohtani, R.

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