Analysis on equivalent current source of AES-128 circuit for HD power model verification

Kengo Iokibe, Kazuhiro Maeshima, Hiroto Kagotani, Yasuyuki Nogami, Yoshitaka Toyota, Tetsushi Watanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We analyzed equivalent current source of cryptographic circuits implemented on a field programmable gate array (FPGA). The equivalent current source represented internal switching current behaviors in the cryptographic circuits during an Advanced Encryption Standard (AES) operation. In this work, the internal current was analyzed for extracting leakage functions and correlation coefficients from scatter diagrams of the Hamming Distance (HD) of AES intermediate values and the current magnitudes. The obtained leakage functions were confirmed a well-known assumption on the HD power model that magnitude of switching current due to transition of register states is proportional to HD of the register. The internal current was also investigated in terms of correlation with the HD model. Correlation coefficients increased as transforming the external power trace in the internal current because two types of noise were reduced by the transform; constant noise and overlap effect of successive rounds. The noise reduction inferred that the use of the internal current source would provide more precise verification of countermeasures.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages302-305
Number of pages4
Volume2014-December
ISBN (Print)9784885522871
Publication statusPublished - Dec 23 2014
Event2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014 - Tokyo, Japan
Duration: May 12 2014May 16 2014

Other

Other2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014
CountryJapan
CityTokyo
Period5/12/145/16/14

Fingerprint

Hamming distance
Cryptography
Networks (circuits)
Noise abatement
Acoustic noise
registers
Field programmable gate arrays (FPGA)
correlation coefficients
leakage
countermeasures
field-programmable gate arrays
noise reduction
diagrams

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Iokibe, K., Maeshima, K., Kagotani, H., Nogami, Y., Toyota, Y., & Watanabe, T. (2014). Analysis on equivalent current source of AES-128 circuit for HD power model verification. In IEEE International Symposium on Electromagnetic Compatibility (Vol. 2014-December, pp. 302-305). [6997165] Institute of Electrical and Electronics Engineers Inc..

Analysis on equivalent current source of AES-128 circuit for HD power model verification. / Iokibe, Kengo; Maeshima, Kazuhiro; Kagotani, Hiroto; Nogami, Yasuyuki; Toyota, Yoshitaka; Watanabe, Tetsushi.

IEEE International Symposium on Electromagnetic Compatibility. Vol. 2014-December Institute of Electrical and Electronics Engineers Inc., 2014. p. 302-305 6997165.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Iokibe, K, Maeshima, K, Kagotani, H, Nogami, Y, Toyota, Y & Watanabe, T 2014, Analysis on equivalent current source of AES-128 circuit for HD power model verification. in IEEE International Symposium on Electromagnetic Compatibility. vol. 2014-December, 6997165, Institute of Electrical and Electronics Engineers Inc., pp. 302-305, 2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014, Tokyo, Japan, 5/12/14.
Iokibe K, Maeshima K, Kagotani H, Nogami Y, Toyota Y, Watanabe T. Analysis on equivalent current source of AES-128 circuit for HD power model verification. In IEEE International Symposium on Electromagnetic Compatibility. Vol. 2014-December. Institute of Electrical and Electronics Engineers Inc. 2014. p. 302-305. 6997165
Iokibe, Kengo ; Maeshima, Kazuhiro ; Kagotani, Hiroto ; Nogami, Yasuyuki ; Toyota, Yoshitaka ; Watanabe, Tetsushi. / Analysis on equivalent current source of AES-128 circuit for HD power model verification. IEEE International Symposium on Electromagnetic Compatibility. Vol. 2014-December Institute of Electrical and Electronics Engineers Inc., 2014. pp. 302-305
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