Analysis of plane wave scattering by a conducting thin plate and a criterion for ray tracing method

Kazunori Uchida, Tetsuro Imai, Teruya Fujii, Masaharu Hata

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This paper presents almost rigorous WienerHopf solutions to the plane wave scattering by a conducting finite thin plate. The final field expressions are given in an analytically compact form and the results are accurate as long as the plate width is greater than the wavelength. Numerical examples are given for the near and far field distributions. A criterion is also proposed to estimate under what condition the ray tracing method holds.

Original languageEnglish
Pages (from-to)618-621
Number of pages4
JournalIEICE Transactions on Electronics
VolumeE81-C
Issue number4
Publication statusPublished - Jan 1 1998

Keywords

  • Near and far fields
  • Ray tracing method
  • Wiener-hopf technique

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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