### Abstract

A method for evaluating the distribution of electrical potential around multiple spherical defects was proposed. As the method is based on the known solution for a single defect, the electric field can be efficiently analyzed in comparison with the other methods, such as the finite element method. The electric field in a conductive material with multiple spherical defects at random locations is estimated by the method. The analysis shows that the increase in the potential difference normalized by the potential difference without defects, Δ V/V_{0}, is in proportion to the product of the volumetric density of defects and the mean of cubed defect radius, n _{t}[r^{3}]_{m}. The universal relationship is independent of the location of defects and the distribution of defect radius. Thus, the damage due to the multiple defects can be evaluated by the increase in potential difference.

Original language | English |
---|---|

Pages (from-to) | 693-700 |

Number of pages | 8 |

Journal | Nippon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A |

Volume | 65 |

Issue number | 632 |

Publication status | Published - 1999 |

Externally published | Yes |

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### Keywords

- Defect-current modification method
- Direct current
- Electric potential difference
- Multiple spherical defects
- Nondestructive inspection
- Numerical analysis

### ASJC Scopus subject areas

- Mechanical Engineering
- Mechanics of Materials
- Materials Science(all)

### Cite this

*Nippon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A*,

*65*(632), 693-700.

**Analysis of direct current potential field around multiple spherical defects.** / Tada, Naoya; Nakayama, Eisuke; Kitamura, Takayuki; Ohtani, Ryuichi.

Research output: Contribution to journal › Article

*Nippon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A*, vol. 65, no. 632, pp. 693-700.

}

TY - JOUR

T1 - Analysis of direct current potential field around multiple spherical defects

AU - Tada, Naoya

AU - Nakayama, Eisuke

AU - Kitamura, Takayuki

AU - Ohtani, Ryuichi

PY - 1999

Y1 - 1999

N2 - A method for evaluating the distribution of electrical potential around multiple spherical defects was proposed. As the method is based on the known solution for a single defect, the electric field can be efficiently analyzed in comparison with the other methods, such as the finite element method. The electric field in a conductive material with multiple spherical defects at random locations is estimated by the method. The analysis shows that the increase in the potential difference normalized by the potential difference without defects, Δ V/V0, is in proportion to the product of the volumetric density of defects and the mean of cubed defect radius, n t[r3]m. The universal relationship is independent of the location of defects and the distribution of defect radius. Thus, the damage due to the multiple defects can be evaluated by the increase in potential difference.

AB - A method for evaluating the distribution of electrical potential around multiple spherical defects was proposed. As the method is based on the known solution for a single defect, the electric field can be efficiently analyzed in comparison with the other methods, such as the finite element method. The electric field in a conductive material with multiple spherical defects at random locations is estimated by the method. The analysis shows that the increase in the potential difference normalized by the potential difference without defects, Δ V/V0, is in proportion to the product of the volumetric density of defects and the mean of cubed defect radius, n t[r3]m. The universal relationship is independent of the location of defects and the distribution of defect radius. Thus, the damage due to the multiple defects can be evaluated by the increase in potential difference.

KW - Defect-current modification method

KW - Direct current

KW - Electric potential difference

KW - Multiple spherical defects

KW - Nondestructive inspection

KW - Numerical analysis

UR - http://www.scopus.com/inward/record.url?scp=71249158256&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=71249158256&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:71249158256

VL - 65

SP - 693

EP - 700

JO - Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A

JF - Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A

SN - 0387-5008

IS - 632

ER -