Analysis of direct current potential difference in a multiple-cracked material

Naoya Tada, Yoshihiko Hayashi, Takayuki Kitamura, Ryuichi Ohtani

Research output: Contribution to journalArticle

Abstract

The electric field in a conductive material with multiple circular cracks is analyzed by means of the crack-flow modification method (CFMM). It is found that the increase in the potential difference of the cracked material normalized by the potential difference without cracks, ΔV/V0, is in proportion to the product of the effective volumetric crack density and the mean of the cubed crack radius, neff[r3]m. This universal relationship is also valid for multiple semi-circular cracks on the surface of the material and gives the physical meaning of damage detected by the direct current electrical potential method.

Original languageEnglish
Pages (from-to)2235-2242
Number of pages8
JournalNippon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A
Volume63
Issue number614
Publication statusPublished - Oct 1997
Externally publishedYes

Fingerprint

Cracks
Conductive materials
Electric fields

ASJC Scopus subject areas

  • Mechanical Engineering

Cite this

Analysis of direct current potential difference in a multiple-cracked material. / Tada, Naoya; Hayashi, Yoshihiko; Kitamura, Takayuki; Ohtani, Ryuichi.

In: Nippon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A, Vol. 63, No. 614, 10.1997, p. 2235-2242.

Research output: Contribution to journalArticle

@article{8e0806f21baf4f478090fe74d9afd879,
title = "Analysis of direct current potential difference in a multiple-cracked material",
abstract = "The electric field in a conductive material with multiple circular cracks is analyzed by means of the crack-flow modification method (CFMM). It is found that the increase in the potential difference of the cracked material normalized by the potential difference without cracks, ΔV/V0, is in proportion to the product of the effective volumetric crack density and the mean of the cubed crack radius, neff[r3]m. This universal relationship is also valid for multiple semi-circular cracks on the surface of the material and gives the physical meaning of damage detected by the direct current electrical potential method.",
author = "Naoya Tada and Yoshihiko Hayashi and Takayuki Kitamura and Ryuichi Ohtani",
year = "1997",
month = "10",
language = "English",
volume = "63",
pages = "2235--2242",
journal = "Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A",
issn = "0387-5008",
publisher = "Japan Society of Mechanical Engineers",
number = "614",

}

TY - JOUR

T1 - Analysis of direct current potential difference in a multiple-cracked material

AU - Tada, Naoya

AU - Hayashi, Yoshihiko

AU - Kitamura, Takayuki

AU - Ohtani, Ryuichi

PY - 1997/10

Y1 - 1997/10

N2 - The electric field in a conductive material with multiple circular cracks is analyzed by means of the crack-flow modification method (CFMM). It is found that the increase in the potential difference of the cracked material normalized by the potential difference without cracks, ΔV/V0, is in proportion to the product of the effective volumetric crack density and the mean of the cubed crack radius, neff[r3]m. This universal relationship is also valid for multiple semi-circular cracks on the surface of the material and gives the physical meaning of damage detected by the direct current electrical potential method.

AB - The electric field in a conductive material with multiple circular cracks is analyzed by means of the crack-flow modification method (CFMM). It is found that the increase in the potential difference of the cracked material normalized by the potential difference without cracks, ΔV/V0, is in proportion to the product of the effective volumetric crack density and the mean of the cubed crack radius, neff[r3]m. This universal relationship is also valid for multiple semi-circular cracks on the surface of the material and gives the physical meaning of damage detected by the direct current electrical potential method.

UR - http://www.scopus.com/inward/record.url?scp=0031247190&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031247190&partnerID=8YFLogxK

M3 - Article

VL - 63

SP - 2235

EP - 2242

JO - Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A

JF - Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A

SN - 0387-5008

IS - 614

ER -