Advantage of thin-film filter for reliable photoemission spectroscopy using high-flux discharging lamp

Takayoshi Yokoya, Shunsuke Tsuda, Takayuki Kiss, Shik Shin, Takashi Mochiku, Kazuto Hirata

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

An aluminum film with a thickness of 1500Å has been used as a filter for the He Iα resonance line (21.2182eV) from a microwave-driven high-flux discharging lamp to reduce the degradation of sample surfaces during photoemission spectroscopy (PES) measurements. A marked increase in the lifetime of sample surfaces, which overcomes a ∼90% intensity reduction, has been observed. The thin-film filter, if combined with a high-flux discharging lamp, provides clean vacuum ultraviolet lights for reliable PES measurements with an ultrahigh resolution.

Original languageEnglish
Pages (from-to)3618-3619
Number of pages2
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume43
Issue number6 A
Publication statusPublished - Jun 2004
Externally publishedYes

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Keywords

  • Aluminum thin-film filter
  • Angle-resolved photoemission spectroscop
  • Degradation free
  • Discharging lamp

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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