Accurate modeling of event-by-event backprojection for a germanium semiconductor Compton camera for system response evaluation in the LM-ML-EM image reconstruction method

Takahiro Ida, Shinji Motomura, Masashi Ueda, Yasuyoshi Watanabe, Shuichi Enomoto

Research output: Contribution to journalArticle

Abstract

We develop an image reconstruction method, considering the physical phenomenon in the measurement process of a Compton camera. The image quality is improved by applying an accurate error model of the Compton scattering angle. The angular error has two properties: an error distribution function specific to the detector material and the variation of its function parameters, depending on each measurement event. We incorporate these factors into the backprojection of the list-mode maximum-likelihood expectation-maximization method as the system response function. We apply our image reconstruction method to simulated data assumed to be measured by a Ge-semiconductor Compton camera GREI, and the imaging data of a tumor-bearing live mouse obtained using GREI. This method is evaluated by comparing an image with variable angular error with that having fixed angular error. The consideration of the variable angle estimation error improves the spatial resolution and reduces image roughness.

Original languageEnglish
Article number016002
JournalJapanese Journal of Applied Physics
Volume58
Issue number1
DOIs
Publication statusPublished - Jan 1 2019

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image reconstruction
Image reconstruction
Germanium
germanium
Cameras
cameras
Semiconductor materials
evaluation
Bearings (structural)
Compton scattering
error functions
lists
Error analysis
Image quality
Maximum likelihood
Distribution functions
mice
Tumors
roughness
tumors

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Accurate modeling of event-by-event backprojection for a germanium semiconductor Compton camera for system response evaluation in the LM-ML-EM image reconstruction method. / Ida, Takahiro; Motomura, Shinji; Ueda, Masashi; Watanabe, Yasuyoshi; Enomoto, Shuichi.

In: Japanese Journal of Applied Physics, Vol. 58, No. 1, 016002, 01.01.2019.

Research output: Contribution to journalArticle

@article{93fc47f2fd7a410589cc82025a0f7f48,
title = "Accurate modeling of event-by-event backprojection for a germanium semiconductor Compton camera for system response evaluation in the LM-ML-EM image reconstruction method",
abstract = "We develop an image reconstruction method, considering the physical phenomenon in the measurement process of a Compton camera. The image quality is improved by applying an accurate error model of the Compton scattering angle. The angular error has two properties: an error distribution function specific to the detector material and the variation of its function parameters, depending on each measurement event. We incorporate these factors into the backprojection of the list-mode maximum-likelihood expectation-maximization method as the system response function. We apply our image reconstruction method to simulated data assumed to be measured by a Ge-semiconductor Compton camera GREI, and the imaging data of a tumor-bearing live mouse obtained using GREI. This method is evaluated by comparing an image with variable angular error with that having fixed angular error. The consideration of the variable angle estimation error improves the spatial resolution and reduces image roughness.",
author = "Takahiro Ida and Shinji Motomura and Masashi Ueda and Yasuyoshi Watanabe and Shuichi Enomoto",
year = "2019",
month = "1",
day = "1",
doi = "10.7567/1347-4065/aae8e9",
language = "English",
volume = "58",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",
issn = "0021-4922",
publisher = "INSTITUTE OF PURE AND APPLIED PHYSICS",
number = "1",

}

TY - JOUR

T1 - Accurate modeling of event-by-event backprojection for a germanium semiconductor Compton camera for system response evaluation in the LM-ML-EM image reconstruction method

AU - Ida, Takahiro

AU - Motomura, Shinji

AU - Ueda, Masashi

AU - Watanabe, Yasuyoshi

AU - Enomoto, Shuichi

PY - 2019/1/1

Y1 - 2019/1/1

N2 - We develop an image reconstruction method, considering the physical phenomenon in the measurement process of a Compton camera. The image quality is improved by applying an accurate error model of the Compton scattering angle. The angular error has two properties: an error distribution function specific to the detector material and the variation of its function parameters, depending on each measurement event. We incorporate these factors into the backprojection of the list-mode maximum-likelihood expectation-maximization method as the system response function. We apply our image reconstruction method to simulated data assumed to be measured by a Ge-semiconductor Compton camera GREI, and the imaging data of a tumor-bearing live mouse obtained using GREI. This method is evaluated by comparing an image with variable angular error with that having fixed angular error. The consideration of the variable angle estimation error improves the spatial resolution and reduces image roughness.

AB - We develop an image reconstruction method, considering the physical phenomenon in the measurement process of a Compton camera. The image quality is improved by applying an accurate error model of the Compton scattering angle. The angular error has two properties: an error distribution function specific to the detector material and the variation of its function parameters, depending on each measurement event. We incorporate these factors into the backprojection of the list-mode maximum-likelihood expectation-maximization method as the system response function. We apply our image reconstruction method to simulated data assumed to be measured by a Ge-semiconductor Compton camera GREI, and the imaging data of a tumor-bearing live mouse obtained using GREI. This method is evaluated by comparing an image with variable angular error with that having fixed angular error. The consideration of the variable angle estimation error improves the spatial resolution and reduces image roughness.

UR - http://www.scopus.com/inward/record.url?scp=85059851715&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85059851715&partnerID=8YFLogxK

U2 - 10.7567/1347-4065/aae8e9

DO - 10.7567/1347-4065/aae8e9

M3 - Article

VL - 58

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 1

M1 - 016002

ER -