TY - GEN
T1 - Accuracy improvement in contact type of on-the machine measurement system
AU - Suzuki, H.
AU - Onishi, T.
AU - Moriwaki, T.
AU - Okino, T.
AU - Hijikata, Y.
AU - Sugawara, J.
AU - Fukuta, M.
PY - 2007/1/1
Y1 - 2007/1/1
N2 - In this research, a new contact type of on-the machine measurement system is proposed and developed to precisely measure aspherical surfaces with large NA. The measuring probe scans the workpiece surface with a tilting angle of 45 degrees to the normal vector of the surface in order to keep the probe contact force constant. The air slide table is made of light SIALON ceramic, which has a high rigidly and a low thermal expansion. A linear glass scale system of 0.14 nm in resolution was used as a sensor. The measurement accuracy of the proposed system was simulated and evaluated experimentally compared with the conventional method.
AB - In this research, a new contact type of on-the machine measurement system is proposed and developed to precisely measure aspherical surfaces with large NA. The measuring probe scans the workpiece surface with a tilting angle of 45 degrees to the normal vector of the surface in order to keep the probe contact force constant. The air slide table is made of light SIALON ceramic, which has a high rigidly and a low thermal expansion. A linear glass scale system of 0.14 nm in resolution was used as a sensor. The measurement accuracy of the proposed system was simulated and evaluated experimentally compared with the conventional method.
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M3 - Conference contribution
AN - SCOPUS:84908240554
T3 - Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007
SP - 234
EP - 241
BT - Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007
A2 - Thornett, E.
PB - euspen
T2 - 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007
Y2 - 20 May 2007 through 24 May 2007
ER -