A simple method for measuring the relative permittivity of printed circuit board materials

Akihiro Namba; Osami Wada; Yoshitaka Toyota; Yukihiro Fukumoto; Zhi Liang Wang; Ryuji Koga; Takuya Miyashita; Tetsushi Watanabe

doi:10.1109/15.974630

A simple method for measuring the relative permittivity of printed circuit board materials

Akihiro Namba, Osami Wada, Yoshitaka Toyota, Yukihiro Fukumoto, Zhi Liang Wang, Ryuji Koga, Takuya Miyashita, Tetsushi Watanabe

Research output: Contribution to journal › Article › peer-review

53 Citations (Scopus)

Abstract

This paper presents a simple method to measure the relative permittivity of glass-epoxy printed circuit boards (PCBs). In this method, relative permittivity as a function of frequency is measured using an actual PCB. In order to estimate relative permittivity, the reflection coefficient is measured with a network analyzer. Relative permittivity is calculated by observing the frequencies of the resonant cavity modes. We show that the relative permittivity of a FR-4 sample decreases from 4.3 to 4.2 at frequencies from 300 MHz to 2 GHz.

Original language	English
Pages (from-to)	515-519
Number of pages	5
Journal	IEEE Transactions on Electromagnetic Compatibility
Volume	43
Issue number	4
DOIs	https://doi.org/10.1109/15.974630
Publication status	Published - Nov 2001

Keywords

Frequency characteristic
Mode identification
Permittivity measurement
Printed circuit board
Rectangular cavity resonator
Reflection coefficient

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/15.974630

Cite this

A simple method for measuring the relative permittivity of printed circuit board materials. / Namba, Akihiro; Wada, Osami; Toyota, Yoshitaka; Fukumoto, Yukihiro; Wang, Zhi Liang; Koga, Ryuji; Miyashita, Takuya; Watanabe, Tetsushi.

In: IEEE Transactions on Electromagnetic Compatibility, Vol. 43, No. 4, 11.2001, p. 515-519.

Research output: Contribution to journal › Article › peer-review

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AU - Wang, Zhi Liang

AU - Koga, Ryuji

AU - Miyashita, Takuya

AU - Watanabe, Tetsushi

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KW - Permittivity measurement

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KW - Reflection coefficient

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A simple method for measuring the relative permittivity of printed circuit board materials

Abstract

Keywords

ASJC Scopus subject areas

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