A proposal of test code generation tool for Java programming learning assistant system

Nobuo Funabiki, Ryota Kusaka, Nobuya Ishihara, Wen Chung Kao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

To advance Java programming educations, we have developed the Java programming learning assistant system (JPLAS) that can verify the correctness of the code from a student automatically using the test-driven development (TDD) method. Then, to register a new assignment in JPLAS, teachers are required to write the test code in addition to the reference source code. Unfortunately, most teachers at schools are not accustomed to writing test codes. In this paper, we propose a test code generation tool that automatically generates the test cases from the reference source code by extracting the outputs for given inputs using functions in JUnit. As assignments for Java novice students, the code that contains standard inputs/outputs is emphasized. For evaluation, we collected 97 codes containing standard inputs/outputs from Java programming text books or Web sites. The experimental result has shown that the proposed tool correctly generated the test codes for them except for one code using a random generator.

Original languageEnglish
Title of host publicationProceedings - 31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages51-56
Number of pages6
ISBN (Electronic)9781509060283
DOIs
Publication statusPublished - May 5 2017
Event31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017 - Taipei, Taiwan, Province of China
Duration: Mar 27 2017Mar 29 2017

Other

Other31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017
CountryTaiwan, Province of China
CityTaipei
Period3/27/173/29/17

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Code generation

Keywords

  • Automatic generation
  • Java programming
  • JPLAS
  • JUnit
  • Test case
  • Test code

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Funabiki, N., Kusaka, R., Ishihara, N., & Kao, W. C. (2017). A proposal of test code generation tool for Java programming learning assistant system. In Proceedings - 31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017 (pp. 51-56). [7920889] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/AINA.2017.60

A proposal of test code generation tool for Java programming learning assistant system. / Funabiki, Nobuo; Kusaka, Ryota; Ishihara, Nobuya; Kao, Wen Chung.

Proceedings - 31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 51-56 7920889.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Funabiki, N, Kusaka, R, Ishihara, N & Kao, WC 2017, A proposal of test code generation tool for Java programming learning assistant system. in Proceedings - 31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017., 7920889, Institute of Electrical and Electronics Engineers Inc., pp. 51-56, 31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017, Taipei, Taiwan, Province of China, 3/27/17. https://doi.org/10.1109/AINA.2017.60
Funabiki N, Kusaka R, Ishihara N, Kao WC. A proposal of test code generation tool for Java programming learning assistant system. In Proceedings - 31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 51-56. 7920889 https://doi.org/10.1109/AINA.2017.60
Funabiki, Nobuo ; Kusaka, Ryota ; Ishihara, Nobuya ; Kao, Wen Chung. / A proposal of test code generation tool for Java programming learning assistant system. Proceedings - 31st IEEE International Conference on Advanced Information Networking and Applications, AINA 2017. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 51-56
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