Hiroki Mori

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2013
Benchmarking of a surface potential based organic thin-film transistor model against C₁₀-DNTT high performance test devices
Maiti, T. K., Hayashi, T., Mori, H., Kang, M. J., Takimiya, K., Miura-Mattausch, M. & Mattausch, H. J., 2013, 2013 IEEE International Conference on Microelectronic Test Structures, ICMTS 2013 - Conference Proceedings. p. 157-161 5 p. 6528164. (IEEE International Conference on Microelectronic Test Structures).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
6 Citations (Scopus)

Research output